Inventor · disambiguated record
Ondrej L. Krivanek
Also filed as: KRIVANEK ONDREJ L
15 granted patents·639 citations·filing 1987–2010
95Inventor score
Top patents by PatentIndex Score
15 records- 0191US6552340B1Autoadjusting charged-particle probe-forming apparatusNION CO·Filed 2000·Granted Apr 22, 2003·102 cites·16 claims
- 0289US5798524AAutomated adjustment of an energy filtering transmission electron microscopeGATAN INC·Filed 1996·Granted Aug 25, 1998·71 cites·25 claims
- 0389US4743756AParallel-detection electron energy-loss spectrometerGATAN INC·Filed 1987·Granted May 10, 1988·44 cites·11 claims
- 0488US5065029ACooled CCD camera for an electron microscopeGATAN INC·Filed 1990·Granted Nov 12, 1991·57 cites·12 claims
- 0587US5300776AAutoadjusting electron microscopeGATAN INC·Filed 1992·Granted Apr 5, 1994·56 cites·10 claims
- 0687US4851670AEnergy-selected electron imaging filterGATAN INC·Filed 1987·Granted Jul 25, 1989·39 cites·9 claims
- 0786US5097126AHigh resolution electron energy loss spectrometerGATAN INC·Filed 1990·Granted Mar 17, 1992·52 cites·10 claims
- 0885US6770887B2Aberration-corrected charged-particle optical apparatusFiled 2002·Granted Aug 3, 2004·42 cites·20 claims
- 0984US5517033AApparatus for improved image resolution in electron microscopyGATAN INC·Filed 1994·Granted May 14, 1996·47 cites·22 claims
- 1077US5635720AResolution-enhancement device for an optically-coupled image sensor for an electron microscopeGATAN INC·Filed 1995·Granted Jun 3, 1997·30 cites·20 claims
- 1177US4831255AVariable-attenuation parallel detectorGATAN INC·Filed 1988·Granted May 16, 1989·23 cites·10 claims
- 1265US8373137B2High resolution energy-selecting electron beam apparatusNION CO·Filed 2010·Granted Feb 12, 2013·2 cites·17 claims
- 1362US5818035AOptically coupled large-format solid state imaging apparatus having edges of an imaging deviceGATAN INC·Filed 1996·Granted Oct 6, 1998·32 cites·9 claims
- 1461US5946033AMethod and apparatus for multiple read-out speeds for a CTDGATAN INC·Filed 1996·Granted Aug 31, 1999·28 cites·3 claims
- 1560US5640012APrecision-controlled slit mechanism for electron microscopeGATAN INC·Filed 1995·Granted Jun 17, 1997·14 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →