Inventor · disambiguated record
One-Gyun La
Also filed as: LA ONE-GYUN
13 granted patents·1 pending application·250 citations·filing 1999–2005
93Inventor score
Technology areasG11C
Files withSAMSUNG ELECTRONICS CO LTD14
Top patents by PatentIndex Score
14 records- 0191US6728162B2Data input circuit and method for synchronous semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Apr 27, 2004·55 cites·21 claims
- 0284US6483769B2SDRAM having posted CAS function of JEDEC standardSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Nov 19, 2002·40 cites·9 claims
- 0382US7016237B2Data input circuit and method for synchronous semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Mar 21, 2006·27 cites·17 claims
- 0476US6359828B1Column address decoder and decoding method for controlling column select line enable timeSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Mar 19, 2002·25 cites·14 claims
- 0573US6868034B2Circuits and methods for changing page length in a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Mar 15, 2005·20 cites·29 claims
- 0672US6762972B2Synchronous semiconductor memory device and method of processing data thereofSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jul 13, 2004·20 cites·13 claims
- 0769US6819616B2Serial to parallel data input methods and related input buffersSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Nov 16, 2004·18 cites·41 claims
- 0865US7054202B2High burst rate write data paths for integrated circuit memory devices and methods of operating sameSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted May 30, 2006·13 cites·41 claims
- 0959US6151272AIntegrated circuit memory devices that utilize data masking techniques to facilitate test mode analysisSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Nov 21, 2000·15 cites·10 claims
- 1049US7068550B24-bit prefetch-type FCRAM having improved data write control circuit in memory cell array and method of masking data using the 4-bit prefetch-type FCRAMSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jun 27, 2006·6 cites·15 claims
- 1146US6842373B2Command decoder and decoding method for use in semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jan 11, 2005·5 cites·31 claims
- 1243US7017010B2Integrated circuit memory device supporting an N bit prefetch scheme and a 2N burst lengthSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Mar 21, 2006·3 cites·11 claims
- 1343US6272068B1Integrated circuit memory devices that utilize data masking techniques to facilitate test mode analysisSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Aug 7, 2001·3 cites·14 claims
- 1438US2006067158A1Integrated circuit memory device supporting an N bit prefetch scheme and a 2N burst lengthSAMSUNG ELECTRONICS CO LTD·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →