Inventor · disambiguated record
Ophir Gvirtzer
Also filed as: GVIRTZER OPHIR
4 granted patents·1 pending application·16 citations·filing 2007–2020
68Inventor score
Top patents by PatentIndex Score
5 records- 0177US8238647B2Method and system for defect detectionBEN-YISHAY MICHAEL·Filed 2011·Granted Aug 7, 2012·13 cites·10 claims
- 0256US2020238511A1Robot apparatus, methods and computer productsANTS TECH HK LIMITED·Filed 2020·Application pending·0 cites
- 0347US8160350B2Method and system for evaluating a variation in a parameter of a patternYISHAI MICHAEL BEN·Filed 2007·Granted Apr 17, 2012·2 cites·34 claims
- 0446US7970201B2Method and system for defect detectionAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted Jun 28, 2011·1 cites·43 claims
- 0542US10661438B2Robot apparatus, methods and computer productsANTS TECH HK LIMITED·Filed 2017·Granted May 26, 2020·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →