Inventor · disambiguated record
Oskar Kowarik
Also filed as: HOFFMANN KURT · KOWARIK OSKAR · KOWARIK OSKAR DR
24 granted patents·733 citations·filing 1987–2003
96Inventor score
Top patents by PatentIndex Score
24 records- 0198US5276643AIntegrated semiconductor circuitSIEMENS AG·Filed 1991·Granted Jan 4, 1994·422 cites·17 claims
- 0287US6388917B2Method for nondestructively reading memory cells of an MRAM memoryINFINEON TECHNOLOGIES AG·Filed 2001·Granted May 14, 2002·43 cites·14 claims
- 0386US6317356B1Configuration for self-referencing ferroelectric memory cellsINFINEON TECHNOLOGIES AG·Filed 2000·Granted Nov 13, 2001·42 cites·13 claims
- 0474US5184326AIntegrated semiconductor memory of the dram type and method for testing the sameSIEMENS AG·Filed 1990·Granted Feb 2, 1993·36 cites·28 claims
- 0571US4956819ACircuit configuration and a method of testing storage cellsSIEMENS AG·Filed 1988·Granted Sep 11, 1990·19 cites·9 claims
- 0669US6747891B2Circuit for non-destructive, self-normalizing reading-out of MRAM memory cellsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jun 8, 2004·17 cites·11 claims
- 0768US6404668B2Memory configuration including a plurality of resistive ferroelectric memory cellsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jun 11, 2002·16 cites·9 claims
- 0864US4922134ATestable redundancy decoder of an integrated semiconductor memorySIEMENS AG·Filed 1989·Granted May 1, 1990·20 cites·8 claims
- 0960US6392918B2Circuit configuration for generating a reference voltage for reading a ferroelectric memoryINFINEON TECHNOLOGIES AG·Filed 2001·Granted May 21, 2002·11 cites·3 claims
- 1060US4906994AMulti-stage integrated decoder deviceSIEMENS AKTIENGELSELLSCHAFT·Filed 1988·Granted Mar 6, 1990·18 cites·7 claims
- 1157US6627935B2Resistive ferroelectric memory cellINFINEON TECHNOLOGIES AG·Filed 2001·Granted Sep 30, 2003·12 cites·8 claims
- 1253US6768667B2Semiconductor memory deviceINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jul 27, 2004·7 cites·15 claims
- 1352US4885748AMethod and circuit configuration of the parallel input of data into a semiconductor memorySIEMENS AG·Filed 1988·Granted Dec 5, 1989·13 cites·13 claims
- 1451US4855621AMulti-stage, integrated decoder device having redundancy test enableSIEMENS AG·Filed 1988·Granted Aug 8, 1989·12 cites·6 claims
- 1547US6452830B2Memory configuration including a plurality of resistive ferroelectric memory cellsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Sep 17, 2002·5 cites·8 claims
- 1646US4803386ADigital amplifier configuration in integrated circuitsSIEMENS AG·Filed 1987·Granted Feb 7, 1989·9 cites·3 claims
- 1745US6407945B2Method for reading nonvolatile semiconductor memory configurationsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jun 18, 2002·5 cites·6 claims
- 1844US6480044B2Semiconductor circuit configurationINFINEON TECHNOLOGIES AG·Filed 2001·Granted Nov 12, 2002·2 cites·15 claims
- 1943US4896322ACircuit configuration and a method for the testing of storage cellsSIEMENS AG·Filed 1988·Granted Jan 23, 1990·8 cites·12 claims
- 2041US5030861AGate circuit having MOS transistorsSIEMENS AG·Filed 1988·Granted Jul 9, 1991·7 cites·13 claims
- 2134US6806550B2Evaluation configuration for semiconductor memoriesINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 19, 2004·0 cites·11 claims
- 2234US5774014AIntegrated buffer circuit which functions independently of fluctuations on the supply voltageSIEMENS AG·Filed 1996·Granted Jun 30, 1998·5 cites·5 claims
- 2333US5253209AIntegrated semiconductor memorySIEMENS AG·Filed 1991·Granted Oct 12, 1993·4 cites·13 claims
- 2429USRE36061EIntegrated semiconductor memorySIEMENS AG·Filed 1995·Granted Jan 26, 1999·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →