Inventor · disambiguated record
Osamu Nagano
Also filed as: NAGANO OSAMU
40 granted patents·4 pending applications·914 citations·filing 1987–2021
98Inventor score
Top patents by PatentIndex Score
44 records- 0197US6563308B2Eddy current loss measuring sensor, thickness measuring system, thickness measuring method, and recorded mediumTOSHIBA KK·Filed 2001·Granted May 13, 2003·144 cites·47 claims
- 0296US11569061B2Multibeam scanning apparatus and multibeam scanning methodKIOXIA CORP·Filed 2021·Granted Jan 31, 2023·3 cites·14 claims
- 0393US7012039B2Oxide catalyst compositionASAHI KASEI CHEMICALS CORP·Filed 2002·Granted Mar 14, 2006·59 cites·8 claims
- 0490US5416299APulse welding apparatusMITSUBISHI ELECTRIC CORP·Filed 1994·Granted May 16, 1995·54 cites·15 claims
- 0587US5726419APulse welding apparatusMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Mar 10, 1998·54 cites·19 claims
- 0687US5317116APulse welding apparatusMITSUBISHI ELECTRIC CORP·Filed 1990·Granted May 31, 1994·48 cites·6 claims
- 0786US7692163B2Charged particle beam apparatus, defect correcting method, etching method, deposition method, and charge preventing methodTOSHIBA KK·Filed 2007·Granted Apr 6, 2010·8 cites·8 claims
- 0885US5495091APulse welding apparatusMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Feb 27, 1996·42 cites·10 claims
- 0982US7304320B2Charged beam exposure apparatus, charged beam control method and manufacturing method of semiconductor deviceTOSHIBA KK·Filed 2005·Granted Dec 4, 2007·6 cites·20 claims
- 1082US5281791APulsed arc welding apparatusMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Jan 25, 1994·41 cites·35 claims
- 1180US5200331AMethod of producing an amide utilizing a microorganismASAHI CHEMICAL IND·Filed 1990·Granted Apr 6, 1993·29 cites·1 claims
- 1278US5658842AAmmoxidation catalyst composition, and process for producing acrylonitrile or methacrylonitrile using the sameASAHI CHEMICAL IND·Filed 1995·Granted Aug 19, 1997·51 cites·23 claims
- 1377US7491945B2Charged particle beam apparatus, charged particle beam control method, substrate inspection method and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2005·Granted Feb 17, 2009·4 cites·9 claims
- 1477US7487286B2Flash memory and method for controlling the memorySPANSION LLC·Filed 2005·Granted Feb 3, 2009·11 cites·10 claims
- 1576US6940080B2Charged particle beam lithography system, lithography method using charged particle beam, method of controlling charged particle beam, and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2003·Granted Sep 6, 2005·12 cites·40 claims
- 1675US8090186B2Pattern inspection apparatus, pattern inspection method, and manufacturing method of semiconductor deviceNAGANO OSAMU·Filed 2009·Granted Jan 3, 2012·12 cites·20 claims
- 1774US5728894AMethod for producing methacroleinASHAHI KASEI KOGYO KABUSHIKI K·Filed 1995·Granted Mar 17, 1998·45 cites·9 claims
- 1871US7095023B2Charged particle beam apparatus, charged particle detection method, and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2004·Granted Aug 22, 2006·8 cites·19 claims
- 1971US7087551B2Catalyst for use in catalytic oxidation or ammoxidation of propane or isobutane in the gaseous phaseASAHI CHEMICAL IND·Filed 2002·Granted Aug 8, 2006·11 cites·12 claims
- 2068US5406052APulsed arc welding equipmentMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Apr 11, 1995·26 cites·44 claims
- 2167US6815698B2Charged particle beam exposure systemTOKYO SHIBAURA ELECTRIC CO·Filed 2001·Granted Nov 9, 2004·11 cites·25 claims
- 2266US7722121B2Reclining deviceSHIROKI KOGYO CO LTD·Filed 2005·Granted May 25, 2010·10 cites·9 claims
- 2366US7109501B2Charged particle beam lithography system, pattern drawing method, and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2004·Granted Sep 19, 2006·6 cites·20 claims
- 2465US5638389AOutput control apparatus for laser oscillatorMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jun 10, 1997·24 cites·8 claims
- 2564US9814707B2Cancer stem cell proliferation inhibitor and intracellular active oxygen accumulation inducerUNIV KEIO·Filed 2015·Granted Nov 14, 2017·1 cites·6 claims
- 2663US4737146AMulti-lumen epidural catheterAMAKI YOSHIKIYO·Filed 1987·Granted Apr 12, 1988·120 cites·1 claims
- 2761US5841096ALaser machining apparatus and method of controlling sameMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Nov 24, 1998·22 cites·4 claims
- 2857US8121390B2Pattern inspection method, pattern inspection apparatus and semiconductor device manufacturing methodNAGANO OSAMU·Filed 2008·Granted Feb 21, 2012·3 cites·19 claims
- 2957US5961857ALaser machining apparatus with feed forward and feedback controlMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Oct 5, 1999·16 cites·18 claims
- 3053US7047154B2Interconnection pattern inspection method, manufacturing method of semiconductor device and inspection apparatusTOSHIBA KK·Filed 2004·Granted May 16, 2006·4 cites·9 claims
- 3151US8357895B2Defect inspection apparatus, defect inspection method, and semiconductor device manufacturing methodTOSHIBA KK·Filed 2009·Granted Jan 22, 2013·0 cites·24 claims
- 3249US11376266B2Antitumor agentUNIV KEIO·Filed 2017·Granted Jul 5, 2022·0 cites·4 claims
- 3349US10309913B2Pattern inspection method using charged particle beamTOSHIBA MEMORY CORP·Filed 2018·Granted Jun 4, 2019·0 cites·20 claims
- 3448US7640138B2Interconnection pattern inspection method, manufacturing method of semiconductor device and inspection apparatusTOSHIBA KK·Filed 2006·Granted Dec 29, 2009·0 cites·14 claims
- 3548US5408482AApparatus for and method of controlling the output of a laser sourceMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Apr 18, 1995·12 cites·6 claims
- 3647US10677743B1Inspection apparatus and inspection methodTOSHIBA MEMORY CORP·Filed 2019·Granted Jun 9, 2020·0 cites·14 claims
- 3747US2015241369A1Charged particle beam apparatus, image acquiring method and non-transitory computer-readable recording mediumTOSHIBA KK·Filed 2014·Application pending·0 cites
- 3846US2021043417A1Inspection method and inspection apparatusKIOXIA CORP·Filed 2020·Application pending·0 cites
- 3944US2022347125A1Antitumor agent and compounding agentUNIV KEIO·Filed 2020·Application pending·0 cites
- 4042US5499257AOutput control apparatus for laser oscillatorMITSUBISHI ELECTRIC CORP·Filed 1994·Granted Mar 12, 1996·7 cites·8 claims
- 4140US6008469ALaser beam branching apparatusMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Dec 28, 1999·10 cites·16 claims
- 4239US10803576B2Defect inspection apparatus and defect inspection methodTOSHIBA MEMORY CORP·Filed 2018·Granted Oct 13, 2020·0 cites·16 claims
- 4333US2016093465A1Defect inspection apparatus and defect inspection methodTOSHIBA KK·Filed 2015·Application pending·0 cites
- 4430US9960010B2Signal processing method and signal processing apparatusKADOWAKI MOTOKI·Filed 2012·Granted May 1, 2018·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →