Inventor · disambiguated record
Osamu Nasu
Also filed as: NASU OSAMU
54 granted patents·19 pending applications·771 citations·filing 1993–2022
98Inventor score
Top patents by PatentIndex Score
73 records- 0199USD876466SDisplay screen with graphical user interfaceMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Feb 25, 2020·245 cites·1 claims
- 0297US8304725B2Charged particle beam systemKOMURO OSAMU·Filed 2010·Granted Nov 6, 2012·111 cites·9 claims
- 0396USD872117SDisplay screen with graphical user interfaceMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Jan 7, 2020·57 cites·1 claims
- 0496US5668368AApparatus for suppressing electrification of sample in charged beam irradiation apparatusHITACHI LTD·Filed 1996·Granted Sep 16, 1997·98 cites·19 claims
- 0595USD924909SDisplay screen with graphical user interfaceMITSUBISHI ELECTRIC CORP·Filed 2019·Granted Jul 13, 2021·93 cites·1 claims
- 0689US12242845B2Development support device, non-transitory computer-readable medium, and development support methodMITSUBISHI ELECTRIC CORP·Filed 2020·Granted Mar 4, 2025·2 cites·15 claims
- 0789US5576538AApparatus and method for ion beam neutralizationHITACHI LTD·Filed 1995·Granted Nov 19, 1996·47 cites·22 claims
- 0887US7545977B2Image processing apparatus for analysis of pattern matching failureHITACHI HIGH TECH CORP·Filed 2006·Granted Jun 9, 2009·10 cites·8 claims
- 0986US8263934B2Method for detecting information of an electric potential on a sample and charged particle beam apparatusYAMAZAKI MINORU·Filed 2007·Granted Sep 11, 2012·7 cites·18 claims
- 1085US5466929AApparatus and method for suppressing electrification of sample in charged beam irradiation apparatusHITACHI LTD·Filed 1993·Granted Nov 14, 1995·37 cites·17 claims
- 1182US11353860B2Data analysis device, system, method, and recording medium storing programMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Jun 7, 2022·2 cites·18 claims
- 1278US11826865B2Machine tool machining dimensions prediction device, machine tool equipment abnormality determination device, machine tool machining dimensions prediction system, and machine tool machining dimensions prediction methodMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Nov 28, 2023·2 cites·12 claims
- 1377USD951284SDisplay screen with graphical user interfaceMITSUBISHI ELECTRIC CORP·Filed 2019·Granted May 10, 2022·17 cites·1 claims
- 1477US7851754B2Charged particle beam systemHITACHI HIGH TECH CORP·Filed 2007·Granted Dec 14, 2010·3 cites·18 claims
- 1575US7659508B2Method for measuring dimensions of sample and scanning electron microscopeHITACHI LTD·Filed 2002·Granted Feb 9, 2010·11 cites·11 claims
- 1674US10725794B2Data processing device, data processing method, setting management device, and data processing systemMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Jul 28, 2020·2 cites·11 claims
- 1774US10613960B2Information processing apparatus and information processing methodMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Apr 7, 2020·1 cites·15 claims
- 1869US11367020B2Signal selection device, learning device, and signal selection method and programMITSUBISHI ELECTRIC CORP·Filed 2019·Granted Jun 21, 2022·1 cites·15 claims
- 1969US11177828B2Data collection apparatus, method, and programMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Nov 16, 2021·1 cites·13 claims
- 2069US8200006B2Image processing apparatus for analysis of pattern matching failureIKEDA MITSUJI·Filed 2009·Granted Jun 12, 2012·6 cites·12 claims
- 2167US9605981B1Absolute encoderMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Mar 28, 2017·1 cites·12 claims
- 2266US8817869B2Image processing device and method, and image display device and methodKUBO TOSHIAKI·Filed 2011·Granted Aug 26, 2014·2 cites·18 claims
- 2363USD951285SDisplay screen with graphical user interfaceMITSUBISHI ELECTRIC CORP·Filed 2019·Granted May 10, 2022·9 cites·1 claims
- 2462US8954496B2Multi-screen display systemSUKENO JUNJI·Filed 2011·Granted Feb 10, 2015·2 cites·20 claims
- 2561US8294118B2Method for adjusting optical axis of charged particle radiation and charged particle radiation deviceKONO AKEMI·Filed 2010·Granted Oct 23, 2012·3 cites·5 claims
- 2659US8766182B2Method for detecting information of an electric potential on a sample and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 1, 2014·0 cites·8 claims
- 2757US11042786B2Learning processing device, data analysis device, analytical procedure selection method, and recording mediumMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Jun 22, 2021·0 cites·17 claims
- 2857US8487250B2Method for detecting information of an electronic potential on a sample and charged particle beam apparatusYAMAZAKI MINORU·Filed 2012·Granted Jul 16, 2013·0 cites·11 claims
- 2957US8080789B2Sample dimension measuring method and scanning electron microscopeNASU OSAMU·Filed 2009·Granted Dec 20, 2011·0 cites·4 claims
- 3056US2023053174A1Data amount sufficiency determination device, data amount sufficiency determination method, learning model generation system, trained model generation method, and mediumMITSUBISHI ELECTRIC CORP·Filed 2022·Application pending·0 cites
- 3155US9792688B2Position detection deviceMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Oct 17, 2017·1 cites·17 claims
- 3255US2025363772A1Image analysis device, image processing device, image processing system, image processing method, and non-transitory computer-readable storage mediumMITSUBISHI ELECTRIC CORP·Filed 2022·Application pending·0 cites
- 3353US11782395B2Diagnostic device, diagnostic method and programMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Oct 10, 2023·0 cites·8 claims
- 3453US11237548B2Data delivery control apparatus, method, and programMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Feb 1, 2022·0 cites·7 claims
- 3553US7714288B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted May 11, 2010·0 cites·17 claims
- 3652US11157333B2Data processing device, data processing system, data processing method, and programMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Oct 26, 2021·0 cites·14 claims
- 3751US11474985B2Data processing apparatus, method, and recording mediumMITSUBISHI ELECTRIC CORP·Filed 2019·Granted Oct 18, 2022·0 cites·13 claims
- 3851US8026482B2Charged particle beam apparatus and control method thereforHITACHI HIGH TECH CORP·Filed 2008·Granted Sep 27, 2011·0 cites·17 claims
- 3950US11474876B2Data processing device including a data collector to collect data and output information relating to a result of execution of a data processing flow, data processing system, data processing method, and programMITSUBISHI ELECTRIC CORP·Filed 2019·Granted Oct 18, 2022·0 cites·12 claims
- 4050US11042737B2Learning device, learning method and programMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Jun 22, 2021·0 cites·16 claims
- 4149US11442433B2Management device, management system, management method, and program for providing virtual and real resource information valuesMITSUBISHI ELECTRIC CORP·Filed 2019·Granted Sep 13, 2022·0 cites·20 claims
- 4249US10833924B2Data collecting apparatus, data collecting method, and programMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Nov 10, 2020·0 cites·9 claims
- 4348US11363003B2Data management device, data management system, data management method, and programMITSUBISHI ELECTRIC CORP·Filed 2019·Granted Jun 14, 2022·0 cites·10 claims
- 4448US2024281948A1Image processing device, and image processing methodMITSUBISHI ELECTRIC CORP·Filed 2021·Application pending·0 cites
- 4548US2024104890A1Image processing device, recording medium, and image processing methodMITSUBISHI ELECTRIC CORP·Filed 2020·Application pending·0 cites
- 4647US2022206888A1Abnormal portion detecting device, method of detecting abnormal portion, and recording mediumMITSUBISHI ELECTRIC CORP·Filed 2019·Application pending·0 cites
- 4747US2022147615A1Data processing device, data processing method, and programMITSUBISHI ELECTRIC CORP·Filed 2019·Application pending·0 cites
- 4846US11966218B2Diagnosis device, diagnosis method and programMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Apr 23, 2024·0 cites·15 claims
- 4946US9000366B2Method and apparatus for measuring displacement between patterns and scanning electron microscope installing unit for measuring displacement between patternsHITACHI HIGH TECH CORP·Filed 2013·Granted Apr 7, 2015·0 cites·10 claims
- 5046US2022121597A1Data processing device, data processing method, and programMITSUBISHI ELECTRIC CORP·Filed 2019·Application pending·0 cites
Showing the top 50 of 73 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →