Inventor · disambiguated record
Osamu Ohno
Also filed as: OHNO OSAMU
10 granted patents·3 pending applications·94 citations·filing 1979–2010
88Inventor score
Files withHITACHI LTD4JUNIPER NETWORKS INC2HITACHI CHEMICAL DIAGNOSTIC IN1HOOL JASON DOMINIK1JAPAN SERVO1
Top patents by PatentIndex Score
13 records- 0172US4357563ADirect current brushless electric motorJAPAN SERVO·Filed 1981·Granted Nov 2, 1982·29 cites·1 claims
- 0259US7065049B2Arbitration method and arbiter circuitJUNIPER NETWORKS INC·Filed 2001·Granted Jun 20, 2006·5 cites·12 claims
- 0355USD457646SDiagnostic instrumentHOOL JASON DOMINIK·Filed 2001·Granted May 21, 2002·12 cites·1 claims
- 0450US6770244B2Dianostic sample tube including anti-rotation apparatusHITACHI CHEMICAL DIAGNOSTIC IN·Filed 2001·Granted Aug 3, 2004·9 cites·20 claims
- 0548US7817548B2Traffic arbitrationJUNIPER NETWORKS INC·Filed 2006·Granted Oct 19, 2010·0 cites·12 claims
- 0642US8705358B2Traffic arbitrationOHNO OSAMU·Filed 2010·Granted Apr 22, 2014·0 cites·20 claims
- 0738US5781905AProgram generating method combining data item part with database manipulation partHITACHI LTD·Filed 1995·Granted Jul 14, 1998·16 cites·7 claims
- 0838US2002061819A1Heat-sensitive recording materialFiled 2001·Application pending·0 cites
- 0937US4291986AOptical rate assay apparatusHITACHI LTD·Filed 1979·Granted Sep 29, 1981·7 cites·10 claims
- 1036US4906348AFlow-through cell provided with reference electrodeHITACHI LTD·Filed 1988·Granted Mar 6, 1990·7 cites·2 claims
- 1134US2002164807A1Diagnostic instrument having overlapping carouselsFiled 2001·Application pending·0 cites
- 1233US2002164808A1Diagnostic pipette assembly including apparatus for automated aspirationFiled 2001·Application pending·0 cites
- 1331US5812981AMethod of creating a data item object suitable for an application from a standard object oriented partHITACHI LTD·Filed 1997·Granted Sep 22, 1998·9 cites·4 claims
Join the waitlist — get patent alerts
Get an alert when Osamu Ohno files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →