Inventor · disambiguated record
Paul D. Berndt
Also filed as: BERNDT PAUL D
5 granted patents·123 citations·filing 1998–2021
81Inventor score
Top patents by PatentIndex Score
5 records- 0191US6825683B1System and method for testing multiple integrated circuits that are in the same packageCYPRESS SEMICONDUCTOR CORP·Filed 2002·Granted Nov 30, 2004·71 cites·18 claims
- 0289US7428678B1Scan testing of integrated circuits with high-speed serial interfaceCYPRESS SEMICONDUCTOR CORP·Filed 2005·Granted Sep 23, 2008·22 cites·7 claims
- 0375US6959257B1Apparatus and method to test high speed devices with a low speed testerCYPRESS SEMICONDUCTOR CORP·Filed 2000·Granted Oct 25, 2005·24 cites·25 claims
- 0461US12048256B2Interfacing with superconducting circuitryMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2021·Granted Jul 23, 2024·0 cites·19 claims
- 0536US6320811B1Multiport memory schemeCYPRESS SEMICONDUCTOR CORP·Filed 1998·Granted Nov 20, 2001·6 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →