Inventor · disambiguated record
Patrick Blanckaert
Also filed as: BLANCKAERT PATRICK
2 granted patents·2 pending applications·5 citations·filing 2012–2017
42Inventor score
Top patents by PatentIndex Score
4 records- 0169US9696146B2Optical scanning probeNIKON METROLOGY NV·Filed 2013·Granted Jul 4, 2017·5 cites·19 claims
- 0242US9205576B2Image forming optical system, imaging apparatus, profile measuring apparatus, structure manufacturing system and structure manufacturing methodNIKON CORP·Filed 2013·Granted Dec 8, 2015·0 cites·35 claims
- 0339US2018135969A1System for measuring the position and movement of an objectNIKON METROLOGY N V·Filed 2017·Application pending·0 cites
- 0427US2014043622A1System for measuring the position and movement of an objectVANDENHOUDT GEERT·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →