Inventor · disambiguated record
Patrick J. Couillard
Also filed as: COUILLARD PATRICK J
3 granted patents·105 citations·filing 1996–1997
76Inventor score
Technology areasH10P
Files withIBM3
Top patents by PatentIndex Score
3 records- 0180US5776645ALithographic print bias/overlay target and applied metrologyIBM·Filed 1997·Granted Jul 7, 1998·59 cites·33 claims
- 0261US5756238ALithographic print bias/overlay target and applied metrologyIBM·Filed 1997·Granted May 26, 1998·24 cites·5 claims
- 0359US5677091ALithographic print bias/overlay target and applied metrologyIBM·Filed 1996·Granted Oct 14, 1997·22 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →