Inventor · disambiguated record
Paul Fewster
Also filed as: FEWSTER PAUL · FEWSTER PAUL F · FEWSTER PAUL FREDERICK
6 granted patents·1 pending application·145 citations·filing 1993–2010
84Inventor score
Top patents by PatentIndex Score
7 records- 0182US6823043B2Determination of material parametersPANALYTICAL BV·Filed 2002·Granted Nov 23, 2004·38 cites·9 claims
- 0276US5748509AAnalysing a material samplePHILIPS CORP·Filed 1995·Granted May 5, 1998·52 cites·20 claims
- 0372US7242743B2X-ray diffraction apparatus and methodPANALYTICAL BV·Filed 2003·Granted Jul 10, 2007·12 cites·10 claims
- 0464US6731719B2X-ray diffractometerPANALYTICAL BV·Filed 2001·Granted May 4, 2004·9 cites·3 claims
- 0563US5442676AMethod of determining a given characteristic of a material samplePHILIPS CORP·Filed 1993·Granted Aug 15, 1995·34 cites·12 claims
- 0640US2004228441A1X-ray diffractometerFiled 2004·Application pending·0 cites
- 0735US8488740B2DiffractometerFEWSTER PAUL·Filed 2010·Granted Jul 16, 2013·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →