Inventor · disambiguated record
Paul W. Forney
Also filed as: FORNEY PAUL W
9 granted patents·3 pending applications·250 citations·filing 2001–2011
91Inventor score
Top patents by PatentIndex Score
12 records- 0192US7925979B2Extensible manufacturing/process control information portal serverINVENSYS SYS INC·Filed 2001·Granted Apr 12, 2011·97 cites·20 claims
- 0287US8015299B2Method and system for administering a concurrent user licensing agreement on a manufacturing/process control information portal serverINVENSYS SYS INC·Filed 2010·Granted Sep 6, 2011·12 cites·20 claims
- 0386US8667017B1Method for portal-based collaborative process management and information accessFORNEY PAUL W·Filed 2011·Granted Mar 4, 2014·35 cites·11 claims
- 0482US7728838B2Method and system for animating graphical user interface elements via a manufacturing/process control portal serverINVENSYS SYS INC·Filed 2001·Granted Jun 1, 2010·31 cites·20 claims
- 0582US7647407B2Method and system for administering a concurrent user licensing agreement on a manufacturing/process control information portal serverINVENSYS SYS INC·Filed 2001·Granted Jan 12, 2010·28 cites·20 claims
- 0676US7941285B2Flow assurance monitoringINVENSYS SYS INC·Filed 2009·Granted May 10, 2011·13 cites·20 claims
- 0776US7502695B2Flow assurance monitoringINVENSYS SYS INC·Filed 2007·Granted Mar 10, 2009·13 cites·20 claims
- 0873US7973794B2Method and system for animating graphical user interface elements via a manufacturing/process control portal serverINVENSYS SYS INC·Filed 2010·Granted Jul 5, 2011·3 cites·27 claims
- 0961US7171316B2Flow assurance monitoringINVENSYS SYS INC·Filed 2004·Granted Jan 30, 2007·18 cites·27 claims
- 1060US2008097622A1Extensible manufacturing/process control information portal serverINVENSYS SYS INC·Filed 2007·Application pending·0 cites
- 1145US2011205079A1Flow assurance monitoringINVENSYS SYS INC·Filed 2011·Application pending·0 cites
- 1241US2008092067A1Custom properties for automation controlINVENSYS SYS INC·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →