Inventor · disambiguated record
Paul Fuller
Also filed as: FULLER PAUL · FULLER PAUL D · FULLER PAUL M
17 granted patents·4 pending applications·374 citations·filing 1996–2023
94Inventor score
Top patents by PatentIndex Score
21 records- 0195US6889357B1Timing calibration pattern for SLDRAMMICRON TECHNOLOGY INC·Filed 2000·Granted May 3, 2005·84 cites·94 claims
- 0294US6550026B1High speed test system for a memory deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 15, 2003·68 cites·10 claims
- 0392US5966388AHigh-speed test system for a memory deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Oct 12, 1999·80 cites·28 claims
- 0490US6154860AHigh-speed test system for a memory deviceMICRON TECHNOLOGY INC·Filed 1999·Granted Nov 28, 2000·63 cites·18 claims
- 0588US8063650B2Testing fuse configurations in semiconductor devicesONG ADRIAN E·Filed 2008·Granted Nov 22, 2011·13 cites·24 claims
- 0679US11595504B2MIPI translation in GMSL tunnel modeMAXIM INTEGRATED PRODUCTS·Filed 2021·Granted Feb 28, 2023·1 cites·20 claims
- 0778US9568544B2Testing fuse configurations in semiconductor devicesRAMBUS INC·Filed 2014·Granted Feb 14, 2017·3 cites·17 claims
- 0875US6055611AMethod and apparatus for enabling redundant memoryMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 25, 2000·36 cites·14 claims
- 0967US11962674B2MIPI translation in gigabit multimedia serial linkMAXIM INTEGRATED PRODUCTS·Filed 2023·Granted Apr 16, 2024·0 cites·20 claims
- 1065US8717052B2Testing fuse configurations in semiconductor devicesONG ADRIAN E·Filed 2011·Granted May 6, 2014·1 cites·4 claims
- 1162US11009548B2Testing fuse configurations in semiconductor devicesRAMBUS INC·Filed 2019·Granted May 18, 2021·0 cites·20 claims
- 1259US7305509B2Method and apparatus for zero stub serial termination capacitor of resistor mounting option in an information handling systemDELL PRODUCTS LP·Filed 2003·Granted Dec 4, 2007·9 cites·21 claims
- 1356US10302696B2Testing fuse configurations in semiconductor devicesRAMBUS INC·Filed 2016·Granted May 28, 2019·0 cites·20 claims
- 1452US7613965B2Apparatus and method for high-speed SAS link protocol testingDELL PRODUCTS LP·Filed 2008·Granted Nov 3, 2009·0 cites·19 claims
- 1550US5783948AMethod and apparatus for enhanced booting and DC conditionsMICRON TECHNOLOGY INC·Filed 1996·Granted Jul 21, 1998·9 cites·27 claims
- 1648US7370253B2Apparatus and method for high-speed SAS link protocol testingDELL PRODUCTS LP·Filed 2006·Granted May 6, 2008·0 cites·18 claims
- 1747US5945845AMethod and apparatus for enhanced booting and DC conditionsMICRON TECHNOLOGY INC·Filed 1998·Granted Aug 31, 1999·7 cites·23 claims
- 1847US2005185498A1Timing calibration pattern for SLDRAMFiled 2005·Application pending·0 cites
- 1943US2006075155A1Information handling system including detection of serial attached small computer systems interface ("SAS") and serial advanced technology attachment ("SATA") devicesDELL PRODUCTS LP·Filed 2004·Application pending·0 cites
- 2042US2008019357A1Apparatus and Method for Determining Device Presence and TypeDELL PRODUCTS LP·Filed 2006·Application pending·0 cites
- 2141US2006206632A1Storage enclosure including a storage device capable of communicating with multiple controllersDELL PRODUCTS LP·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →