Inventor · disambiguated record
Paing Z. Htet
Also filed as: HTET PAING · HTET PAING Z
6 granted patents·6 pending applications·6 citations·filing 2020–2025
73Inventor score
Files withMICRON TECHNOLOGY INC12
Top patents by PatentIndex Score
12 records- 0188US12272408B2Partial block read level voltage compensation to decrease read trigger ratesMICRON TECHNOLOGY INC·Filed 2023·Granted Apr 8, 2025·2 cites·18 claims
- 0288US12224017B2Read level compensation for partially programmed blocks of memory devicesMICRON TECHNOLOGY INC·Filed 2022·Granted Feb 11, 2025·2 cites·20 claims
- 0386US12217799B2Parallelized defect detection across multiple sub-blocks in a memory deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Feb 4, 2025·1 cites·20 claims
- 0479US11475969B2Scan optimization using data selection across wordline of a memory arrayMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 18, 2022·1 cites·18 claims
- 0573US2025266103A1Boost voltage modulated corrective readMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0668US2025201317A1Partial block read level voltage compensation to decrease read trigger ratesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0768US2025124987A1Read level compensation for partially programmed blocks of memory devicesMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 0866US2025140317A1Parallelized defect detection across multiple sub-blocks in a memory deviceMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0963US12315575B2Boost voltage modulated corrective readMICRON TECHNOLOGY INC·Filed 2023·Granted May 27, 2025·0 cites·20 claims
- 1062US11715547B2Scan optimization using data selection across wordline of a memory arrayMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 1, 2023·0 cites·20 claims
- 1147US2025054549A1Partially programmed block padding operationsMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1244US2023206992A1Concurrent scan operation on multiple blocks in a memory deviceMICRON TECHNOLOGY INC·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →