Inventor · disambiguated record
Paul E. Kelley
Also filed as: KELLEY PAUL · KELLEY PAUL E
25 granted patents·1,253 citations·filing 1982–1997
97Inventor score
Technology areasH01J
Top patents by PatentIndex Score
25 records- 0198US4540884AMethod of mass analyzing a sample by use of a quadrupole ion trapFINNIGAN CORP·Filed 1982·Granted Sep 10, 1985·325 cites·23 claims
- 0297US4736101AMethod of operating ion trap detector in MS/MS modeFINNIGAN CORP·Filed 1987·Granted Apr 5, 1988·177 cites·14 claims
- 0395US4749860AMethod of isolating a single mass in a quadrupole ion trapFINNIGAN CORP·Filed 1986·Granted Jun 7, 1988·75 cites·6 claims
- 0494US5134286AMass spectrometry method using notch filterTELEDYNE CME·Filed 1991·Granted Jul 28, 1992·89 cites·18 claims
- 0589US4686367AMethod of operating quadrupole ion trap chemical ionization mass spectrometryFINNIGAN CORP·Filed 1985·Granted Aug 11, 1987·44 cites·5 claims
- 0688US4650999AMethod of mass analyzing a sample over a wide mass range by use of a quadrupole ion trapFINNIGAN CORP·Filed 1984·Granted Mar 17, 1987·33 cites·10 claims
- 0787US5200613AMass spectrometry method using supplemental AC voltage signalsTELEDYNE MEC·Filed 1991·Granted Apr 6, 1993·57 cites·48 claims
- 0883US5864136AMass spectrometry method with two applied trapping fields having the same spatial formTELEDYNE ELECTRONIC TECH·Filed 1997·Granted Jan 26, 1999·31 cites·2 claims
- 0982US5436445AMass spectrometry method with two applied trapping fields having same spatial formTELEDYNE ELECTRONIC TECH·Filed 1994·Granted Jul 25, 1995·29 cites·7 claims
- 1081US5561291AMass spectrometry method with two applied quadrupole fieldsTELEDYNE ELECTRONIC TECH·Filed 1995·Granted Oct 1, 1996·28 cites·6 claims
- 1181US5187365AMass spectrometry method using time-varying filtered noiseTELEDYNE MEC·Filed 1991·Granted Feb 16, 1993·37 cites·24 claims
- 1279US5381007AMass spectrometry method with two applied trapping fields having same spatial formTELEDYNE MEC A DIVISION OF TEL·Filed 1993·Granted Jan 10, 1995·39 cites·57 claims
- 1379US5274233AMass spectrometry method using supplemental AC voltage signalsTELEDYNE MEC·Filed 1992·Granted Dec 28, 1993·26 cites·22 claims
- 1478US5679951AMass spectrometry method with two applied trapping fields having same spatial formTELEDYNE ELECTRONIC TECH·Filed 1996·Granted Oct 21, 1997·23 cites·10 claims
- 1577US5703358AMethod for generating filtered noise signal and braodband signal having reduced dynamic range for use in mass spectrometryTELEDYNE ELECTRONIC TECH·Filed 1995·Granted Dec 30, 1997·29 cites·7 claims
- 1676US5466931AMass spectrometry method using notch filterTELEDYNE ET A DIV OF TELEDYNE·Filed 1994·Granted Nov 14, 1995·25 cites·4 claims
- 1775US5196699AChemical ionization mass spectrometry method using notch filterTELEDYNE MEC·Filed 1991·Granted Mar 23, 1993·28 cites·19 claims
- 1874US5345078AMass spectrometry method using notch filterTELEDYNE MEC·Filed 1993·Granted Sep 6, 1994·19 cites·1 claims
- 1974US5256875AMethod for generating filtered noise signal and broadband signal having reduced dynamic range for use in mass spectrometryTELEDYNE MEC·Filed 1992·Granted Oct 26, 1993·29 cites·28 claims
- 2073US5610397AMass spectrometry method using supplemental AC voltage signalsTELEDYNE ELECTRONIC TECH·Filed 1995·Granted Mar 11, 1997·20 cites·4 claims
- 2173US5206507AMass spectrometry method using filtered noise signalTELEDYNE MEC·Filed 1991·Granted Apr 27, 1993·25 cites·40 claims
- 2272US5449905AMethod for generating filtered noise signal and broadband signal having reduced dynamic range for use in mass spectrometryTELEDYNE ET·Filed 1994·Granted Sep 12, 1995·23 cites·38 claims
- 2367US5508516AMass spectrometry method using supplemental AC voltage signalsTELEDYNE ET·Filed 1994·Granted Apr 16, 1996·15 cites·6 claims
- 2467US5105081AMass spectrometry method and apparatus employing in-trap ion detectionTELEDYNE CME·Filed 1991·Granted Apr 14, 1992·19 cites·10 claims
- 2548US5173604AMass spectrometry method with non-consecutive mass order scanTELEDYNE CME·Filed 1991·Granted Dec 22, 1992·8 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →