Inventor · disambiguated record
Paul Knutrud
Also filed as: KNUTRUD PAUL · KNUTRUD PAUL C
2 granted patents·68 citations·filing 2000–2017
57Inventor score
Top patents by PatentIndex Score
2 records- 0184US6612159B1Overlay registration error measurement made simultaneously for more than two semiconductor wafer layersSCHLUMBERGER TECHNOLOGIES INC·Filed 2000·Granted Sep 2, 2003·68 cites·20 claims
- 0222US10445889B2Method for measuring overlay offset in an integrated circuit and related technologyInspectrology LLC·Filed 2017·Granted Oct 15, 2019·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →