Inventor · disambiguated record
Pablo Nieves
Also filed as: NIEVES PABLO
4 granted patents·4 pending applications·1 citations·filing 2018–2024
56Inventor score
Files withIBM8
Top patents by PatentIndex Score
8 records- 0167US11119148B2Test probe assembly with fiber optic leads and photodetectors for testing semiconductor wafersIBM·Filed 2018·Granted Sep 14, 2021·1 cites·29 claims
- 0260US11796590B2Localized heating/cooling using thermocouple between probe pinsIBM·Filed 2021·Granted Oct 24, 2023·0 cites·16 claims
- 0358US11137418B2Device test pad probe card structure with individual probe manipulation capabilityIBM·Filed 2019·Granted Oct 5, 2021·0 cites·20 claims
- 0457US2025383398A1Testing device for testing semiconductorsIBM·Filed 2024·Application pending·0 cites
- 0557US2025383397A1Testing device for testing semiconductors and methods of fabricationIBM·Filed 2024·Application pending·0 cites
- 0657US2025372463A1Testing structure for semiconductor devicesIBM·Filed 2024·Application pending·0 cites
- 0745US2023176115A1Localized magnetic field testingIBM·Filed 2021·Application pending·0 cites
- 0841US11125780B2Test probe assembly with fiber optic leads and photodetectorsIBM·Filed 2018·Granted Sep 21, 2021·0 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →