Inventor · disambiguated record
Pavel Pokutnev
Also filed as: POKUTNEV PAVEL
2 granted patents·11 citations·filing 2013–2013
49Inventor score
Top patents by PatentIndex Score
2 records- 0187US9146327B2Method for determining geometric imaging properties of a flat panel detector, correspondingly adapted X-ray inspection system and calibration phantomGE SENSING & INSPECTION TECH·Filed 2013·Granted Sep 29, 2015·11 cites·15 claims
- 0242US9042634B2Method system and computer product for non-destructive object analysisGEN ELECTRIC·Filed 2013·Granted May 26, 2015·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →