Inventor · disambiguated record
Paul W. Rutkowski
Also filed as: RUTKOWSKI PAUL W · RUTKOWSKI PAUL WILLIAM
8 granted patents·238 citations·filing 1989–2002
89Inventor score
Top patents by PatentIndex Score
8 records- 0184US5623503AMethod and apparatus for partial-scan testing of a device using its boundary-scan portLUCENT TECHNOLOGIES INC·Filed 1996·Granted Apr 22, 1997·65 cites·6 claims
- 0281US5048021AMethod and apparatus for generating control signalsAT & T BELL LAB·Filed 1989·Granted Sep 10, 1991·38 cites·12 claims
- 0377US5490151ABoundary scan cellAT & T CORP·Filed 1993·Granted Feb 6, 1996·47 cites·5 claims
- 0467US5187712APseudo-exhaustive self-test techniqueAT & T BELL LAB·Filed 1990·Granted Feb 16, 1993·29 cites·5 claims
- 0561US5978947ABuilt-in self-test in a plurality of stages controlled by a token passing network and methodLUCENT TECHNOLOGIES INC·Filed 1997·Granted Nov 2, 1999·23 cites·28 claims
- 0651US5457697APseudo-exhaustive self-test techniqueAT & T CORP·Filed 1992·Granted Oct 10, 1995·15 cites·2 claims
- 0743US6237123B1Built-in self-test controlled by a token network and methodLUCENT TECHNOLOGIES INC·Filed 1997·Granted May 22, 2001·17 cites·9 claims
- 0836US7005873B2Built-in self-test hierarchy for an integrated circuitAGERE SYSTEMS INC·Filed 2002·Granted Feb 28, 2006·4 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →