Inventor · disambiguated record
Patrick M. Shepherd
Also filed as: SHEPHERD PATRICK M
14 granted patents·235 citations·filing 1993–2023
94Inventor score
Top patents by PatentIndex Score
14 records- 0198US11255903B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2020·Granted Feb 22, 2022·12 cites·11 claims
- 0297US9316683B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2015·Granted Apr 19, 2016·19 cites·10 claims
- 0397US8506335B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2013·Granted Aug 13, 2013·31 cites·6 claims
- 0496US8628336B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2013·Granted Jan 14, 2014·26 cites·11 claims
- 0594US8388357B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2012·Granted Mar 5, 2013·12 cites·58 claims
- 0694US8118618B2Apparatus for testing electronic devicesRICHMOND II DONALD P·Filed 2010·Granted Feb 21, 2012·13 cites·59 claims
- 0789US12163999B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2023·Granted Dec 10, 2024·0 cites·22 claims
- 0887US5682472AMethod and system for testing memory programming devicesAEHR TEST SYSTEMS·Filed 1995·Granted Oct 28, 1997·84 cites·50 claims
- 0983US9151797B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2014·Granted Oct 6, 2015·2 cites·6 claims
- 1082US8747123B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2013·Granted Jun 10, 2014·2 cites·5 claims
- 1181US11860221B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2022·Granted Jan 2, 2024·0 cites·12 claims
- 1269US10852347B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2018·Granted Dec 1, 2020·0 cites·14 claims
- 1369US5429510AHigh-density interconnect techniqueAEHR TEST SYSTEMS INC·Filed 1993·Granted Jul 4, 1995·34 cites·12 claims
- 1464US10094872B2Apparatus for testing electronic devicesAEHR TEST SYSTEMS·Filed 2016·Granted Oct 9, 2018·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →