Inventor · disambiguated record
Paul J. Steffan
Also filed as: STEFFAN PAUL J
69 granted patents·2,036 citations·filing 1996–2004
99Inventor score
Files withADVANCED MICRO DEVICES INC68
Top patents by PatentIndex Score
69 records- 0195US5905434AVehicle communication deviceFiled 1997·Granted May 18, 1999·177 cites·12 claims
- 0291US6448606B1Semiconductor with increased gate coupling coefficientADVANCED MICRO DEVICES INC·Filed 2000·Granted Sep 10, 2002·66 cites·12 claims
- 0391US6041270AAutomatic recipe adjust and download based on process control windowADVANCED MICRO DEVICES INC·Filed 1997·Granted Mar 21, 2000·111 cites·3 claims
- 0490US5866437ADynamic process window control using simulated wet data from current and previous layer dataADVANCED MICRO DEVICES INC·Filed 1997·Granted Feb 2, 1999·107 cites·1 claims
- 0588US6204133B1Self-aligned extension junction for reduced gate channelADVANCED MICRO DEVICES INC·Filed 2000·Granted Mar 20, 2001·41 cites·10 claims
- 0686US6239008B1Method of making a density multiplier for semiconductor device manufacturingADVANCED MICRO DEVICES INC·Filed 1999·Granted May 29, 2001·82 cites·9 claims
- 0786US6084679AUniversal alignment marks for semiconductor defect capture and analysisADVANCED MICRO DEVICES INC·Filed 1999·Granted Jul 4, 2000·81 cites·2 claims
- 0885US6524916B1Controlled gate length and gate profile semiconductor device and manufacturing method thereforADVANCED MICRO DEVICES INC·Filed 2002·Granted Feb 25, 2003·32 cites·6 claims
- 0985US6025259ADual damascene process using high selectivity boundary layersADVANCED MICRO DEVICES INC·Filed 1998·Granted Feb 15, 2000·84 cites·5 claims
- 1084US6433371B1Controlled gate length and gate profile semiconductor deviceADVANCED MICRO DEVICES INC·Filed 2000·Granted Aug 13, 2002·31 cites·6 claims
- 1183US5999003AIntelligent usage of first pass defect data for improved statistical accuracy of wafer level classificationADVANCED MICRO DEVICES INC·Filed 1997·Granted Dec 7, 1999·67 cites·4 claims
- 1282US6291332B1Electroless plated semiconductor vias and channelsADVANCED MICRO DEVICES INC·Filed 1999·Granted Sep 18, 2001·63 cites·20 claims
- 1381US6287968B1Method of defining copper seed layer for selective electroless plating processingADVANCED MICRO DEVICES INC·Filed 1999·Granted Sep 11, 2001·62 cites·2 claims
- 1480US6013570ALDD transistor using novel gate trim techniqueADVANCED MICRO DEVICES INC·Filed 1998·Granted Jan 11, 2000·46 cites·4 claims
- 1579US6274443B1Simplified graded LDD transistor using controlled polysilicon gate profileADVANCED MICRO DEVICES INC·Filed 1998·Granted Aug 14, 2001·49 cites·13 claims
- 1676US6377898B1Automatic defect classification comparator die selection systemADVANCED MICRO DEVICES INC·Filed 1999·Granted Apr 23, 2002·48 cites·4 claims
- 1771US6338001B1In line yield prediction using ADC determined kill ratios die health statistics and die stackingADVANCED MICRO DEVICES INC·Filed 1999·Granted Jan 8, 2002·37 cites·4 claims
- 1871US6261960B1High density contacts having rectangular cross-section for dual damascene applicationsADVANCED MICRO DEVICES INC·Filed 2000·Granted Jul 17, 2001·18 cites·4 claims
- 1967US6185511B1Method to accurately determine classification codes for defects during semiconductor manufacturingADVANCED MICRO DEVICES INC·Filed 1997·Granted Feb 6, 2001·32 cites·4 claims
- 2067US6091138AMulti-chip packaging using bump technologyADVANCED MICRO DEVICES INC·Filed 1998·Granted Jul 18, 2000·33 cites·5 claims
- 2167US5985753AMethod to manufacture dual damascene using a phantom implant maskADVANCED MICRO DEVICES INC·Filed 1998·Granted Nov 16, 1999·33 cites·10 claims
- 2266US6423557B1ADC based in-situ destructive analysis selection and methodology thereforADVANCED MICRO DEVICES INC·Filed 2001·Granted Jul 23, 2002·10 cites·3 claims
- 2366US5776811ASimplified process for fabricating flash eeprom cellsADVANCED MICRO DEVICES INC·Filed 1996·Granted Jul 7, 1998·25 cites·7 claims
- 2465US6287922B1Method for fabricating graded LDD transistor using controlled polysilicon gate profileADVANCED MICRO DEVICES INC·Filed 1998·Granted Sep 11, 2001·24 cites·15 claims
- 2565US6100593AMultiple chip hybrid package using bump technologyADVANCED MICRO DEVICES INC·Filed 1998·Granted Aug 8, 2000·30 cites·4 claims
- 2664US6177287B1Simplified inter database communication systemADVANCED MICRO DEVICES INC·Filed 1998·Granted Jan 23, 2001·25 cites·1 claims
- 2764US6103616AMethod to manufacture dual damascene structures by utilizing short resist spacersADVANCED MICRO DEVICES INC·Filed 1998·Granted Aug 15, 2000·30 cites·6 claims
- 2864US5966459AAutomatic defect classification (ADC) reclassification engineADVANCED MICRO DEVICES INC·Filed 1997·Granted Oct 12, 1999·59 cites·5 claims
- 2963US6506639B1Method of forming low resistance reduced channel length transistorsADVANCED MICRO DEVICES INC·Filed 2000·Granted Jan 14, 2003·11 cites·10 claims
- 3063US6200823B1Method for isolation of optical defect imagesADVANCED MICRO DEVICES INC·Filed 1999·Granted Mar 13, 2001·27 cites·4 claims
- 3162US6350639B1Simplified graded LDD transistor using controlled polysilicon gate profileADVANCED MICRO DEVICES INC·Filed 2001·Granted Feb 26, 2002·7 cites·6 claims
- 3262US6191044B1Method for forming graded LDD transistor using controlled polysilicon gate profileADVANCED MICRO DEVICES INC·Filed 1998·Granted Feb 20, 2001·26 cites·18 claims
- 3360US6468815B1Overlay radius offset shift engineADVANCED MICRO DEVICES INC·Filed 2000·Granted Oct 22, 2002·7 cites·10 claims
- 3459US6421574B1Automatic defect classification system based variable sampling planADVANCED MICRO DEVICES INC·Filed 1999·Granted Jul 16, 2002·22 cites·7 claims
- 3558US6430572B1Recipe management database systemADVANCED MICRO DEVICES INC·Filed 1999·Granted Aug 6, 2002·33 cites·7 claims
- 3658US6424881B1Computer generated recipe selector utilizing defect file informationADVANCED MICRO DEVICES INC·Filed 1999·Granted Jul 23, 2002·22 cites·3 claims
- 3758US6303394B1Global cluster pre-classification methodologyADVANCED MICRO DEVICES INC·Filed 1998·Granted Oct 16, 2001·21 cites·6 claims
- 3857US7137085B1Wafer level global bitmap characterization in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2004·Granted Nov 14, 2006·8 cites·20 claims
- 3957US6107204AMethod to manufacture multiple damascene by utilizing etch selectivityADVANCED MICRO DEVICES INC·Filed 1998·Granted Aug 22, 2000·22 cites·2 claims
- 4057US6063685ADevice level identification methodologyADVANCED MICRO DEVICES INC·Filed 1998·Granted May 16, 2000·24 cites·7 claims
- 4156US6165805AScan tool recipe serverADVANCED MICRO DEVICES INC·Filed 1998·Granted Dec 26, 2000·19 cites·4 claims
- 4255US6284553B1Location dependent automatic defect classificationADVANCED MICRO DEVICES INC·Filed 1999·Granted Sep 4, 2001·19 cites·8 claims
- 4355US6154711ADisposition tool for factory process controlADVANCED MICRO DEVICES INC·Filed 1997·Granted Nov 28, 2000·19 cites·2 claims
- 4455US6035244AAutomatic defect reclassification of known propagator defectsADVANCED MICRO DEVICES INC·Filed 1997·Granted Mar 7, 2000·29 cites·2 claims
- 4554US6011619ASemiconductor wafer optical scanning system and method using swath-area defect limitationADVANCED MICRO DEVICES INC·Filed 1997·Granted Jan 4, 2000·17 cites·9 claims
- 4654US5862055AAutomatic defect classification individual defect predicate value retentionADVANCED MICRO DEVICES INC·Filed 1997·Granted Jan 19, 1999·40 cites·3 claims
- 4751US6512842B1Composition based association engine for image archival systemsADVANCED MICRO DEVICES INC·Filed 1999·Granted Jan 28, 2003·19 cites·5 claims
- 4850US7590309B1Image processing in integrated circuit technology developmentADVANCED MICRO DEVICES INC·Filed 2004·Granted Sep 15, 2009·3 cites·9 claims
- 4950US7251793B1Predicting defect future effects in integrated circuit technology development to facilitate semiconductor wafer lot dispositionADVANCED MICRO DEVICES INC·Filed 2004·Granted Jul 31, 2007·2 cites·20 claims
- 5050US6238940B1Intra-tool defect offset systemADVANCED MICRO DEVICES INC·Filed 1999·Granted May 29, 2001·15 cites·6 claims
Showing the top 50 of 69 patent records by PatentIndex Score.
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