Inventor · disambiguated record
Patrick Villard
Also filed as: VILLARD PATRICK
11 granted patents·27 citations·filing 2003–2015
85Inventor score
Files withCOMMISSARIAT ENERGIE ATOMIQUE7QUINSAT MICHAEL1ROSTAING JEAN-PIERRE1THABUIS TRISTAN1ZARUDNIEV MYKHAILO1
Top patents by PatentIndex Score
11 records- 0187US9515608B2Multimode oscillator enabling simultaneous monitoring of variations in several resonance frequencies of a resonatorCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2015·Granted Dec 6, 2016·6 cites·15 claims
- 0267US9013241B2Circuit for measuring the resonant frequency of nanoresonatorsCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2013·Granted Apr 21, 2015·1 cites·14 claims
- 0367US8642359B2Electromagnetic coupling device of an electromagnetic radiation detectorROSTAING JEAN-PIERRE·Filed 2007·Granted Feb 4, 2014·2 cites·14 claims
- 0467US8577320B2Oscillation detectorQUINSAT MICHAEL·Filed 2012·Granted Nov 5, 2013·3 cites·10 claims
- 0561US8860836B2Device and method for compressing an image for an image sensorTHABUIS TRISTAN·Filed 2010·Granted Oct 14, 2014·3 cites·11 claims
- 0657US7702062B2Electronic sensor with optimized counting capacityCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2008·Granted Apr 20, 2010·2 cites·15 claims
- 0756US7575165B2Portable object having multi-level demodulation and being inductively coupled to a fixed stationCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2004·Granted Aug 18, 2009·6 cites·10 claims
- 0855US9602114B2Phase-locked loop with multiple degrees of freedom and its design and fabrication methodCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2015·Granted Mar 21, 2017·1 cites·16 claims
- 0937US9100025B2Circuit for measuring the resonant frequency of nanoresonatorsCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2014·Granted Aug 4, 2015·0 cites·19 claims
- 1037US7126410B2Charge pump with charge injectionCOMMISSARIAT ENERGIE ATOMIQUE·Filed 2003·Granted Oct 24, 2006·3 cites·5 claims
- 1131US8558623B2Oscillating circuit with giant magnetoresistance effect junctionsZARUDNIEV MYKHAILO·Filed 2011·Granted Oct 15, 2013·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →