Inventor · disambiguated record
Paul J. Whipple
Also filed as: WHIPPLE PAUL J · WHIPPLE PAUL JAMES
2 granted patents·19 citations·filing 2000–2005
58Inventor score
Top patents by PatentIndex Score
2 records- 0160US7633307B2Method for determining temperature profile in semiconductor manufacturing testFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Dec 15, 2009·4 cites·22 claims
- 0258US6433568B1Massive parallel semiconductor manufacturing test processMOTOROLA INC·Filed 2000·Granted Aug 13, 2002·15 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →