Inventor · disambiguated record
Pavel R. Zivny
Also filed as: ZIVNY PAVEL · ZIVNY PAVEL R
11 granted patents·3 pending applications·51 citations·filing 1991–2024
88Inventor score
Top patents by PatentIndex Score
14 records- 0191US12298329B2Termination trigger pick-off for remote head samplerTEKTRONIX INC·Filed 2022·Granted May 13, 2025·1 cites·19 claims
- 0283US9130751B2Methods and systems for analyzing decomposed uncorrelated signal impairmentsZIVNY PAVEL R·Filed 2011·Granted Sep 8, 2015·11 cites·2 claims
- 0381US8594169B2Method for decomposing and analyzing jitter using spectral analysis and time-domain probability densityZIVNY PAVEL·Filed 2011·Granted Nov 26, 2013·8 cites·28 claims
- 0481US8332172B2System for independently modifying jitter and noise components in a signal digitizing instrumentAGOSTON MARIA·Filed 2011·Granted Dec 11, 2012·9 cites·7 claims
- 0575US8155165B2Method of characterizing parameters and removing spectral components of a spread spectrum clock in a communications signalAGOSTON MARIA·Filed 2008·Granted Apr 10, 2012·7 cites·3 claims
- 0674US9363045B2Bounded uncorrelated signal impairment deconvolution for total signal impairment extrapolationTEKTRONIX INC·Filed 2012·Granted Jun 7, 2016·4 cites·28 claims
- 0770US12385949B2Semi-automated oscilloscope noise compensation based on power spectral density characterizationTEKTRONIX INC·Filed 2023·Granted Aug 12, 2025·0 cites·18 claims
- 0870US7746058B2Sequential equivalent—time sampling with an asynchronous reference clockTEKTRONIX INC·Filed 2008·Granted Jun 29, 2010·6 cites·9 claims
- 0958US12416662B2Machine learning model training using de-noised data and model prediction with noise correctionTEKTRONIX INC·Filed 2023·Granted Sep 16, 2025·0 cites·19 claims
- 1057US2024255572A1Test and measurement instrument having tailored jitter compensationTEKTRONIX INC·Filed 2024·Application pending·0 cites
- 1145US2015350042A1Methods and systems for analyzing decomposed uncorrelated signal impairmentsTEKTRONIX INC·Filed 2015·Application pending·0 cites
- 1243US2011103451A1System for Independently Modifying Jitter and Noise Components in a Signal Measurement DeviceTEKTRONIX INC·Filed 2009·Application pending·0 cites
- 1333US5268851ADetection of metastability in triggersTEKTRONIX INC·Filed 1991·Granted Dec 7, 1993·3 cites·4 claims
- 1427US5530341AExternal clock count based auto trigger for an oscilloscopeTEKTRONIX INC·Filed 1994·Granted Jun 25, 1996·2 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →