Inventor · disambiguated record
Pey-Yuan Lee
Also filed as: LEE PEY-YUAN
3 granted patents·13 citations·filing 2002–2004
64Inventor score
Files withTAIWAN SEMICONDUCTOR MFG3
Top patents by PatentIndex Score
3 records- 0150US6710889B2Method for improved dielectric layer metrology calibrationTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Mar 23, 2004·6 cites·20 claims
- 0246US7196006B2Manufacturing method for microelectronic deviceTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Mar 27, 2007·4 cites·16 claims
- 0345US6862545B1Linewidth measurement tool calibration method employing linewidth standardTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Mar 1, 2005·3 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →