Inventor · disambiguated record
Peter Moeck
Also filed as: MOECK PETER
3 granted patents·1 pending application·11 citations·filing 2002–2010
61Inventor score
Top patents by PatentIndex Score
4 records- 0174US7472576B1Nanometrology device standards for scanning probe microscopes and processes for their fabrication and useOREGON STATE·Filed 2005·Granted Jan 6, 2009·8 cites·17 claims
- 0261US8131481B2Database supported nanocrystal structure identification by lattice-fringe fingerprinting with structure factor extractionMOECK PETER·Filed 2007·Granted Mar 6, 2012·3 cites·14 claims
- 0334US8196216B2Systems for assessing and enhancing the performance of scanning probe microscopes by quantifying and enforcing symmetries and periodicities in two dimensionsMOECK PETER·Filed 2010·Granted Jun 5, 2012·0 cites·15 claims
- 0431US2004168626A1Process for forming semiconductor quantum dots with superior structural and phological stabilityFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →