Inventor · disambiguated record
Peter V. Phillips
Also filed as: PHILLIPS PETER · PHILLIPS PETER V
11 granted patents·1 pending application·888 citations·filing 1990–2011
94Inventor score
Files withAGILENT TECHNOLOGIES INC5ATN MICROWAVE INC5ATE SYSTEMS INC1AUTOMATIC TESTING AND NETWORKI1
Top patents by PatentIndex Score
12 records- 0197US6653848B2Method and apparatus for linear characterization of multi-terminal single-ended or balanced devicesAGILENT TECHNOLOGIES INC·Filed 2001·Granted Nov 25, 2003·198 cites·77 claims
- 0296US6920407B2Method and apparatus for calibrating a multiport test system for measurement of a DUTAGILENT TECHNOLOGIES INC·Filed 2004·Granted Jul 19, 2005·171 cites·24 claims
- 0395US6614237B2Multiport automatic calibration device for a multiport test systemAGILENT TECHNOLOGIES INC·Filed 2001·Granted Sep 2, 2003·174 cites·23 claims
- 0489US5467021ACalibration method and apparatusATN MICROWAVE INC·Filed 1993·Granted Nov 14, 1995·51 cites·38 claims
- 0588US5552714AElectronic calibration method and apparatusATN MICROWAVE INC·Filed 1995·Granted Sep 3, 1996·54 cites·12 claims
- 0687US6826506B2Method and apparatus for calibrating a multiport test system for measurement of a DUTAGILENT TECHNOLOGIES INC·Filed 2001·Granted Nov 30, 2004·32 cites·26 claims
- 0786US5434511AElectronic microwave calibration deviceATN MICROWAVE INC·Filed 1993·Granted Jul 18, 1995·60 cites·14 claims
- 0885US5034708AProgrammable broadband electronic tunerAUTOMATIC TESTING AND NETWORKI·Filed 1990·Granted Jul 23, 1991·49 cites·6 claims
- 0984US5548221AElectronic calibration method and apparatusATN MICROWAVE INC·Filed 1995·Granted Aug 20, 1996·40 cites·6 claims
- 1081US5537046AElectronic calibration method and apparatusATN MICROWAVE INC·Filed 1995·Granted Jul 16, 1996·35 cites·13 claims
- 1178US6853198B2Method and apparatus for performing multiport through-reflect-line calibration and measurementAGILENT TECHNOLOGIES INC·Filed 2002·Granted Feb 8, 2005·24 cites·23 claims
- 1238US2011199107A1Method and apparatus for calibrating a test system for measuring a device under testATE SYSTEMS INC·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →