Inventor · disambiguated record
Pertti Puumalainen
Also filed as: PUUMALAINEN PERTTI
11 granted patents·157 citations·filing 1977–1994
91Inventor score
Files withENSO GUTZEIT OY4PUUMALAINEN PERTTI2PUUMALAISEN TUTKIMUSLAITOS OY2FABRETTI HOLDINGS LTD1ROIBOX OY1
Top patents by PatentIndex Score
11 records- 0185US5047723AMethod for detection of foreign matter contents in gasesPUUMALAINEN PERTTI·Filed 1987·Granted Sep 10, 1991·62 cites·4 claims
- 0263US4147931AProcedure for measuring unit area weightsPUUMALAINEN PERTTI·Filed 1977·Granted Apr 3, 1979·16 cites·2 claims
- 0355US4812665AMethod and apparatus for measuring of humidityROIBOX OY·Filed 1987·Granted Mar 14, 1989·20 cites·6 claims
- 0454US4543487AProcedure and means for creating an electron curtain with adjustable intensity distributionENSO GUTZEIT OY·Filed 1984·Granted Sep 24, 1985·8 cites·7 claims
- 0550US4700486AMeasuring the thickness for a continuous material webPUUMALAISEN TUTKIMUSLAITOS OY·Filed 1986·Granted Oct 20, 1987·13 cites·10 claims
- 0644US5175436AMethod of producing high-energy electron curtains with high performanceTAMPELLA OY AB·Filed 1990·Granted Dec 29, 1992·10 cites·6 claims
- 0738US4572957AMeans for creating an electron curtainENSO GUTZEIT OY·Filed 1984·Granted Feb 25, 1986·4 cites·4 claims
- 0836US5543331AMethod of detection of alien matter contents in gasesFABRETTI HOLDINGS LTD·Filed 1994·Granted Aug 6, 1996·9 cites·5 claims
- 0936US4639942AProcedure for measuring the quantity of silicon coating on paper or cardboardENSO GUTZEIT OY·Filed 1986·Granted Jan 27, 1987·6 cites·7 claims
- 1032US4595840AProcedure and means for observing streaks in the machine direction in paper or in its coatingENSO GUTZEIT OY·Filed 1984·Granted Jun 17, 1986·3 cites·2 claims
- 1129US4669102AMethod and device for operating and focusing tomographic X-ray equipmentPUUMALAISEN TUTKIMUSLAITOS OY·Filed 1983·Granted May 26, 1987·6 cites·9 claims
Join the waitlist — get patent alerts
Get an alert when Pertti Puumalainen files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →