Inventor · disambiguated record
Peter Speckbacher
Also filed as: SPECKBACHER PETER
24 granted patents·2 pending applications·337 citations·filing 1996–2022
95Inventor score
Files withHEIDENHAIN GMBH DR JOHANNES22JOHANNAS HEIDENHAIN GMBH DR1JOHANNES HEIDEN HAIN GMBH DR1SPECKBACHER PETER1WEIDMANN JOSEF1
Top patents by PatentIndex Score
26 records- 0184US6605828B1Optoelectronic component with a space kept free from underfillerHEIDENHAIN GMBH DR JOHANNES·Filed 1999·Granted Aug 12, 2003·61 cites·23 claims
- 0282US10094961B2Optical layer systemHEIDENHAIN GMBH DR JOHANNES·Filed 2016·Granted Oct 9, 2018·5 cites·20 claims
- 0382US7549234B2Method for mounting a scale on a support and arrangement with a support and a scaleHEIDENHAIN GMBH DR JOHANNES·Filed 2007·Granted Jun 23, 2009·10 cites·19 claims
- 0482US5852322ARadiation-sensitive detector element and method for producing itHEIDENHAIN GMBH DR JOHANNES·Filed 1996·Granted Dec 22, 1998·65 cites·21 claims
- 0581US6486467B1Optical detector for measuring relative displacement of an object on which a grated scale is formedJOHANNES HEIDEN HAIN GMBH DR·Filed 1999·Granted Nov 26, 2002·70 cites·28 claims
- 0680US8234793B2Arrangement with a scale fastened on a supportWEIDMANN JOSEF·Filed 2010·Granted Aug 7, 2012·6 cites·18 claims
- 0775US9677874B2Position-measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 2016·Granted Jun 13, 2017·3 cites·13 claims
- 0871US7707739B2Method for attaching a scale to a carrier, a scale, and carrier having a scaleHEIDENHAIN GMBH DR JOHANNES·Filed 2006·Granted May 4, 2010·6 cites·17 claims
- 0971US5786931APhase grating and method of producing phase gratingHEIDENHAIN GMBH DR JOHANNES·Filed 1996·Granted Jul 28, 1998·32 cites·11 claims
- 1068US6445456B2Photoelectric position measuring deviceJOHANNAS HEIDENHAIN GMBH DR·Filed 1997·Granted Sep 3, 2002·31 cites·21 claims
- 1167US6621104B1Integrated optoelectronic thin-film sensor and method of producing sameHEIDENHAIN GMBH DR JOHANNES·Filed 2000·Granted Sep 16, 2003·12 cites·29 claims
- 1264US8650769B2Assembly comprising a measuring scale attached to a substrate and method for holding a measuring scale against a substrateSPECKBACHER PETER·Filed 2010·Granted Feb 18, 2014·2 cites·14 claims
- 1364US6961174B1Reflectometer and method for manufacturing a reflectometerHEIDENHAIN GMBH DR JOHANNES·Filed 2000·Granted Nov 1, 2005·10 cites·36 claims
- 1460US10914615B2Scanning reticle including a grating formed in a substrate for an optical position measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 2018·Granted Feb 9, 2021·0 cites·19 claims
- 1556US7312878B2Method for manufacturing a scale, a scale manufactured according to the method and a position measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 2002·Granted Dec 25, 2007·5 cites·20 claims
- 1656US2024278213A1Photocatalytic layer arrangement and method for producing such a layer arrangementHEIDENHAIN GMBH DR JOHANNES·Filed 2022·Application pending·0 cites
- 1755US10018485B2Scale and position-measuring device having such a scaleHEIDENHAIN GMBH DR JOHANNES·Filed 2017·Granted Jul 10, 2018·0 cites·10 claims
- 1852US2023381766A1Structured layer arrangement and method for producing a layer arrangementHEIDENHAIN GMBH DR JOHANNES·Filed 2021·Application pending·0 cites
- 1950US11480717B2Grating structure for a diffractive opticHEIDENHAIN GMBH DR JOHANNES·Filed 2019·Granted Oct 25, 2022·0 cites·17 claims
- 2050US9453744B2Measuring graduation and photoelectric position measuring device having the sameHEIDENHAIN GMBH DR JOHANNES·Filed 2014·Granted Sep 27, 2016·0 cites·11 claims
- 2148US7058309B1Optoelectronic transceiverHEIDENHAIN GMBH DR JOHANNES·Filed 1999·Granted Jun 6, 2006·17 cites·21 claims
- 2245US7719075B2Scanning head for optical position-measuring systemsHEIDENHAIN GMBH DR JOHANNES·Filed 2004·Granted May 18, 2010·2 cites·20 claims
- 2340US10222192B2Method for machining a scaleHEIDENHAIN GMBH DR JOHANNES·Filed 2017·Granted Mar 5, 2019·0 cites·19 claims
- 2438US10119802B2Optical position-measuring device having grating fields with different step heightsHEIDENHAIN GMBH DR JOHANNES·Filed 2017·Granted Nov 6, 2018·0 cites·9 claims
- 2536US6800404B2Method for producing a self-supporting electron-optical transparent structure, and structure produced in accordance with the methodHEIDENHAIN GMBH DR JOHANNES·Filed 2002·Granted Oct 5, 2004·0 cites·13 claims
- 2635US6844558B1Material measure and position measuring device comprising such a material measureHEIDENHAIN GMBH DR JOHANNES·Filed 2000·Granted Jan 18, 2005·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →