Inventor · disambiguated record
Per Takman
Also filed as: TAKMAN PER
14 granted patents·1 pending application·4 citations·filing 2012–2023
84Inventor score
Top patents by PatentIndex Score
15 records- 0187US11579318B2Characterization of an electron beamEXCILLUM AB·Filed 2020·Granted Feb 14, 2023·2 cites·15 claims
- 0275US11892576B2Characterization of an electron beamEXCILLUM AB·Filed 2023·Granted Feb 6, 2024·0 cites·15 claims
- 0374US11800625B2Mechanical alignment of x-ray sourcesEXCILLUM AB·Filed 2019·Granted Oct 24, 2023·1 cites·14 claims
- 0469US12120807B2Mechanical alignment of x-ray sourcesEXCILLUM AB·Filed 2023·Granted Oct 15, 2024·0 cites·5 claims
- 0568US11979972B2X-ray source with an electromagnetic pumpEXCILLUM AB·Filed 2020·Granted May 7, 2024·0 cites·12 claims
- 0667US10784069B2Structured x-ray targetEXCILLUM AB·Filed 2017·Granted Sep 22, 2020·1 cites·17 claims
- 0764US11963286B2X-ray source and method for generating X-ray radiationEXCILLUM AB·Filed 2022·Granted Apr 16, 2024·0 cites·20 claims
- 0864US11910515B2X-ray source with an electromagnetic pumpEXCILLUM AB·Filed 2020·Granted Feb 20, 2024·0 cites·15 claims
- 0956US11342154B2X-ray source and method for generating x-ray radiationEXCILLUM AB·Filed 2018·Granted May 24, 2022·0 cites·15 claims
- 1054US2025046560A1Method and arrangement for an x-ray sourceEXCILLUM AB·Filed 2022·Application pending·0 cites
- 1151US11257651B2Determining width and height of electron spotEXCILLUM AB·Filed 2019·Granted Feb 22, 2022·0 cites·11 claims
- 1247US10930464B2Vapour monitoringEXCILLUM AB·Filed 2018·Granted Feb 23, 2021·0 cites·15 claims
- 1345US11438996B2Method for protecting an X-ray source and an X-ray sourceEXCILLUM AB·Filed 2019·Granted Sep 6, 2022·0 cites·14 claims
- 1445US9564283B2Limiting migration of target materialHEMBERG OSCAR·Filed 2012·Granted Feb 7, 2017·0 cites·15 claims
- 1543US11350512B2Method for controlling an x-ray sourceEXCILLUM AB·Filed 2019·Granted May 31, 2022·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →