Inventor · disambiguated record
Peng Seng Toh
Also filed as: TOH PENG S · TOH PENG SENG
12 granted patents·3 pending applications·562 citations·filing 1991–2004
94Inventor score
Files withAGILENT TECHNOLOGIES INC6HEWLETT PACKARD CO4AXION INNOVATION LTD1EUROP VISIONS SYSTEMS CENTRE L1GRENIDEA ECODESIGN PTE LTD1
Top patents by PatentIndex Score
15 records- 0196US6838650B1Confocal imagingAGILENT TECHNOLOGIES INC·Filed 2000·Granted Jan 4, 2005·125 cites·8 claims
- 0287US6346966B1Image acquisition system for machine vision applicationsAGILENT TECHNOLOGIES INC·Filed 1997·Granted Feb 12, 2002·111 cites·8 claims
- 0384US6141040AMeasurement and inspection of leads on integrated circuit packagesAGILENT TECHNOLOGIES INC·Filed 1997·Granted Oct 31, 2000·69 cites·6 claims
- 0478US6055055ACross optical axis inspection system for integrated circuitsHEWLETT PACKARD CO·Filed 1998·Granted Apr 25, 2000·51 cites·17 claims
- 0575US5387930AElectronic image acquistion system with image optimization by intensity entropy analysis and feedback controlEUROP VISIONS SYSTEMS CENTRE L·Filed 1991·Granted Feb 7, 1995·47 cites·23 claims
- 0668US6292608B1Line scan cameraAGILENT TECHNOLOGIES INC·Filed 1999·Granted Sep 18, 2001·32 cites·4 claims
- 0768US5537494AVideo image data encoding and compression system using edge detection and luminance profile matchingAXION INNOVATION LTD·Filed 1995·Granted Jul 16, 1996·49 cites·9 claims
- 0858US6242756B1Cross optical axis inspection system for integrated circuitsAGILENT TECHNOLOGIES INC·Filed 1998·Granted Jun 5, 2001·26 cites·17 claims
- 0953US6346965B1High resolution imaging system for simultaneous acquisition of two high aspect ratio object fieldsAGILENT TECHNOLOGIES INC·Filed 1997·Granted Feb 12, 2002·17 cites·10 claims
- 1053US5969374AContrast measurement system for laser marksHEWLETT PACKARD CO·Filed 1998·Granted Oct 19, 1999·15 cites·14 claims
- 1144US2005150624A1Molded fiber manufacturingFiled 2002·Application pending·0 cites
- 1242US6046803ATwo and a half dimension inspection systemHEWLETT PACKARD CO·Filed 1997·Granted Apr 4, 2000·9 cites·1 claims
- 1340US2001012107A1Method and apparatus for inspecting a printed circuit board assemblyFiled 2001·Application pending·0 cites
- 1439US2005022860A1Thin-film photovoltaic moduleGRENIDEA ECODESIGN PTE LTD·Filed 2004·Application pending·0 cites
- 1537US6088108ALeaded components inspection systemHEWLETT PACKARD CO·Filed 1998·Granted Jul 11, 2000·11 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →