Inventor · disambiguated record
Peter Weber
Also filed as: WEBER PETER · WEBER PETER M · WEBER PETER MICHAEL
27 granted patents·1 pending application·351 citations·filing 1986–2023
96Inventor score
Files withSCHURTER HOLDING AG4ZEISS CARL MICROSCOPY GMBH4HARMAN INT IND2OMRON TATEISI ELECTRONICS CO2ROCHE DIAGNOSTICS GMBH2
Top patents by PatentIndex Score
28 records- 0188US6422248B1Device for cleaning pipette needles or stirrersROCHE DIAGNOSTICS GMBH·Filed 1997·Granted Jul 23, 2002·61 cites·12 claims
- 0281US7220972B2Method and apparatus for the characterization and analysis of the shape of molecules and molecular clusters, and for the separation of desired isomers, based on Rydberg statesUNIV BROWN·Filed 2003·Granted May 22, 2007·4 cites·73 claims
- 0380USD771169SMicroscopeZEISS CARL MICROSCOPY GMBH·Filed 2014·Granted Nov 8, 2016·24 cites·1 claims
- 0479US7300525B2Device for cleaning pipette probes or stirrersROCHE DIAGNOSTICS GMBH·Filed 2002·Granted Nov 27, 2007·20 cites·20 claims
- 0577US6824849B2Laser-cuttable multi-layer sheet material3M INNOVATIVE PROPERTIES CO·Filed 2001·Granted Nov 30, 2004·20 cites·5 claims
- 0676USD784433SMicroscopeZEISS CARL MICROSCOPY GMBH·Filed 2014·Granted Apr 18, 2017·20 cites·1 claims
- 0775USD643410SAudio mixing boardHARMAN INT IND·Filed 2010·Granted Aug 16, 2011·29 cites·1 claims
- 0872US10018823B2Force-feedback control device and method for digital microscopeZEISS CARL MICROSCOPY GMBH·Filed 2014·Granted Jul 10, 2018·3 cites·11 claims
- 0972US6145892APress connectorGEBERIT TECHNIK AG·Filed 1998·Granted Nov 14, 2000·36 cites·9 claims
- 1071US4738146APiezoresistive force-measuring element and its use for determining forces acting on a componentKRISTAL INSTR AG·Filed 1986·Granted Apr 19, 1988·28 cites·23 claims
- 1169USD886743SElectric plug receptacleSCHURTER HOLDING AG·Filed 2018·Granted Jun 9, 2020·8 cites·1 claims
- 1266USD777118SCombined touchpad, operating knobs and display module for electrical control deviceZEISS CARL MICROSCOPY GMBH·Filed 2014·Granted Jan 24, 2017·16 cites·1 claims
- 1365US7169275B2Method for separating particles in free flow electrophoresisTECAN TRADING AG·Filed 2003·Granted Jan 30, 2007·8 cites·19 claims
- 1461USD453476SThermometerOMRON TATEISI ELECTRONICS CO·Filed 2001·Granted Feb 12, 2002·13 cites·1 claims
- 1556US7169278B2Apparatus and separation media for separating particles in free-flow electrophoresisTECAN TRADING AG·Filed 2003·Granted Jan 30, 2007·3 cites·19 claims
- 1655USD875683SElectric plug receptacleSCHURTER HOLDING AG·Filed 2018·Granted Feb 18, 2020·4 cites·1 claims
- 1753USD862387SElectric plug receptacleSCHURTER HOLDING AG·Filed 2017·Granted Oct 8, 2019·4 cites·1 claims
- 1853USD449787SThermometerOMRON TATEISI ELECTRONICS CO·Filed 2001·Granted Oct 30, 2001·9 cites·1 claims
- 1951USD643411SAudio mixing boardHARMAN INT IND·Filed 2010·Granted Aug 16, 2011·10 cites·1 claims
- 2049US5067246AGauge for measuring tree-trunk growth and the likeFEINMECH OPTISCHE BETR GMBH·Filed 1991·Granted Nov 26, 1991·18 cites·14 claims
- 2146USD731976SElectric device plugSCHURTER AG·Filed 2014·Granted Jun 16, 2015·5 cites·1 claims
- 2245US11099129B2Spatially resolved standoff trace chemical sensing using backwards transient absorption spectroscopyUNIV BROWN·Filed 2018·Granted Aug 24, 2021·0 cites·6 claims
- 2342US7226653B2Printed circuit board and method for producing a printed circuit boardPPC ELECTRONIC AG·Filed 2001·Granted Jun 5, 2007·1 cites·21 claims
- 2442US2006099338A1Thermally-formable and cross-linkable precursor of a thermally conductive materialBOELZ UWE·Filed 2003·Application pending·0 cites
- 2532USD1098482SLaboratory instrumentVENTANA MED SYST INC·Filed 2023·Granted Oct 14, 2025·0 cites·1 claims
- 2631USD818969SFuse holderSCHURTER HOLDING AG·Filed 2017·Granted May 29, 2018·0 cites·1 claims
- 2731US5983722APiezobloc accelerometerKK HOLDING AG·Filed 1997·Granted Nov 16, 1999·5 cites·12 claims
- 2827US6180911B1Material and geometry design to enhance the operation of a plasma arcRETECH SERVICES INC·Filed 1999·Granted Jan 30, 2001·2 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →