Inventor · disambiguated record
Philippe Lejeune
Also filed as: LEJEUNE PHILIPPE · LEJEUNE PHILIPPE G
10 granted patents·2 pending applications·54 citations·filing 1985–2011
86Inventor score
Files withLEJEUNE PHILIPPE3SOFTLINK3TERADYNE INC2BEALACH NO BO FINNE TEO TA GAL1CPC INTERNATIONAL INC1
Top patents by PatentIndex Score
12 records- 0167US4772774ALaser trimming of electrical componentsTERADYNE INC·Filed 1987·Granted Sep 20, 1988·17 cites·12 claims
- 0264US8497488B2Bell-shaped protection system for a device for treating electron-beam containersLEJEUNE PHILIPPE·Filed 2010·Granted Jul 30, 2013·2 cites·11 claims
- 0352US6813740B1Method for the testing of electronic componentsSOFTLINK·Filed 2000·Granted Nov 2, 2004·7 cites·22 claims
- 0448US6269326B1Method for testing electronic componentsSOFTLINK·Filed 1997·Granted Jul 31, 2001·16 cites·17 claims
- 0539US6426643B1Method for the testing of electronic componentsSOFTLINK·Filed 2000·Granted Jul 30, 2002·2 cites·20 claims
- 0638US2001052116A1Method for the analysis of a test software toolFiled 2001·Application pending·0 cites
- 0737US9265848B2System for protecting a container treatment device by means of an electron beamLEJEUNE PHILIPPE·Filed 2010·Granted Feb 23, 2016·0 cites·12 claims
- 0837USD408970SSki bootSALOMON SA·Filed 1998·Granted May 4, 1999·3 cites·1 claims
- 0937US2013108189A1Method for Manufacturing Sterile Flexible Bags Filled with a Product, Particularly with a Therapeutic Liquid, and Corresponding BagsLEJEUNE PHILIPPE·Filed 2011·Application pending·0 cites
- 1031US4795881ACurved electrical components and laser trimming thereofTERADYNE INC·Filed 1987·Granted Jan 3, 1989·5 cites·7 claims
- 1125US6711519B2Method for the testing of electronic components taking the drift of the mean into accountBEALACH NO BO FINNE TEO TA GAL·Filed 2001·Granted Mar 23, 2004·0 cites·7 claims
- 1223US4806426AMutant microorganisms containing recombinant DNA and their use in the production of amylasesCPC INTERNATIONAL INC·Filed 1985·Granted Feb 21, 1989·2 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →