Inventor · disambiguated record
Phillip E. Wollenhaupt
Also filed as: WOLLENHAUPT PHILLIP E
6 granted patents·150 citations·filing 2010–2018
85Inventor score
Top patents by PatentIndex Score
6 records- 0196US8809780B2Electron beam layer manufacturing using scanning electron monitored closed loop controlSCIAKY INC·Filed 2013·Granted Aug 19, 2014·56 cites·20 claims
- 0295US8598523B2Electron beam layer manufacturing using scanning electron monitored closed loop controlSTECKER SCOTT·Filed 2010·Granted Dec 3, 2013·61 cites·20 claims
- 0393US10071437B2Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop controlSCIAKY INC·Filed 2015·Granted Sep 11, 2018·8 cites·20 claims
- 0478US9174300B2Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop controlSCIAKY INC·Filed 2013·Granted Nov 3, 2015·11 cites·20 claims
- 0577US8461474B2Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop controlWOLLENHAUPT PHILLIP E·Filed 2011·Granted Jun 11, 2013·14 cites·11 claims
- 0667US10946474B2Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop controlSCIAKY INC·Filed 2018·Granted Mar 16, 2021·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →