Inventor · disambiguated record
Pierre Baudet
Also filed as: BAUDET PIERRE · BAUDET PIERRE M · BAUDET PIERRE M M
4 granted patents·5 pending applications·30 citations·filing 1981–2005
73Inventor score
Top patents by PatentIndex Score
9 records- 0160US4485344AApparatus for electromagnetically measuring the ovalization of a ferromagnetic pipePETROLES CIE FRANCAISE·Filed 1981·Granted Nov 27, 1984·16 cites·9 claims
- 0234US2009026501A1Enhancement - depletion semiconductor structure and method for making itKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Application pending·0 cites
- 0333US6703701B2Semiconductor device with integrated circuit elements of group III-V comprising means for preventing pollution by hydrogenKONINKL PHILIPS ELECTRONICS NV·Filed 1999·Granted Mar 9, 2004·5 cites·7 claims
- 0433US2007278519A1Enhancement Depletion Field Effect Transistor Structure and Method of ManufactureKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Application pending·0 cites
- 0533US2009179234A1Field effect transistorKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Application pending·0 cites
- 0633US2008093630A1Heterostructure Field Effect TransistorKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Application pending·0 cites
- 0732US5844321ASemiconductor device comprising a chip which is provided with a via opening and is soldered on a support, and method of realizing this devicePHILIPS CORP·Filed 1997·Granted Dec 1, 1998·7 cites·9 claims
- 0832US2008064155A1Method for Producing a Multi-Stage Recess in a Layer Structure and a Field Effect Transistor with a Multi-Recessed GateKONINKL PHILIPS ELECTRONICS NV·Filed 2005·Application pending·0 cites
- 0927US6291277B1Method of manufacturing a semiconductor device including etching of a stack of layers by means of photolithographyPHILIPS CORP·Filed 1999·Granted Sep 18, 2001·2 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →