Inventor · disambiguated record
Ping Chen
Also filed as: CHEN PING · CHEN PING SHAN
17 granted patents·9 pending applications·145 citations·filing 2006–2021
92Inventor score
Files withSHENZHEN FUTAIHONG PREC IND CO20CHEN PING1FIH HONG KONG LTD1LI LEI1PROMOS TECHNOLOGIES INC1
Top patents by PatentIndex Score
26 records- 0196US7848833B2Flexible fixing system for product testingSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Granted Dec 7, 2010·74 cites·19 claims
- 0293US8210510B2Clamping device for portable electronic deviceLI LEI·Filed 2010·Granted Jul 3, 2012·26 cites·11 claims
- 0379US7543507B2Failure analysis system for printed circuit board and method using the sameSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Granted Jun 9, 2009·11 cites·8 claims
- 0478US7663359B2Testing mechanism for casingsSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Granted Feb 16, 2010·11 cites·15 claims
- 0568US7757566B2Testing system for flip-type electronic deviceSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Granted Jul 20, 2010·5 cites·14 claims
- 0665US7779550B2Micrometer-based measuring system and method of using sameSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Granted Aug 24, 2010·5 cites·19 claims
- 0763US7428783B2Testing system for flatness and parallelismSHENZHEN FUTAIHONG PREC IND CO·Filed 2006·Granted Sep 30, 2008·5 cites·13 claims
- 0861US7984561B2Device for determining dimension of a workpieceSHENZHEN FUTAIHONG PREC IND CO·Filed 2009·Granted Jul 26, 2011·4 cites·10 claims
- 0954US7950130B2Method for making an inspection fixture, and mold assembly used in the methodSHENZHEN FUTAIHONG PREC IND CO·Filed 2006·Granted May 31, 2011·1 cites·11 claims
- 1054US2008154674A1Inventory management system and methodSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Application pending·0 cites
- 1152US7743676B2Key testing apparatusSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Granted Jun 29, 2010·2 cites·20 claims
- 1252US2007255673A1Method for judging standardization order of workpiecesSHENZHEN FUTAIHONG PREC IND CO·Filed 2006·Application pending·0 cites
- 1351US2008147782A1System and method for managing fixture calibration reportSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Application pending·0 cites
- 1450US2008203637A1Clamping device for portable electronic deviceSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Application pending·0 cites
- 1549US7798022B2Testing devices for multihole workpieceSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Granted Sep 21, 2010·0 cites·16 claims
- 1649US7594444B1Test apparatus and method therewithSHENZHEN FUTAIHONG PREC IND CO·Filed 2008·Granted Sep 29, 2009·1 cites·10 claims
- 1746US8250740B2Method for making an inspection fixture, and mold assembly used in the methodCHEN PING·Filed 2011·Granted Aug 28, 2012·0 cites·3 claims
- 1844US7523017B2Workpiece assessment system and method for using the sameSHENZHEN FATAIHONG PREC INDUST·Filed 2007·Granted Apr 21, 2009·0 cites·13 claims
- 1944US2008232670A1Method for calculating a bad-lot continuity and a method for finding a defective machine using the samePROMOS TECHNOLOGIES INC·Filed 2007·Application pending·0 cites
- 2043US2011258220A1Fixture administration system and administration method thereofFIH HONG KONG LTD·Filed 2010·Application pending·0 cites
- 2142US7966891B2Fatigue test apparatus for thin element of electronic deviceSHENZHEN FUTAIHONG PREC IND CO·Filed 2009·Granted Jun 28, 2011·0 cites·20 claims
- 2242US2008141152A1System for managing electronic documents for productsSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Application pending·0 cites
- 2340US7995230B2Label creating apparatus and method for using the sameSHENZHEN FUTAIHONG PREC IND CO·Filed 2008·Granted Aug 9, 2011·0 cites·9 claims
- 2439US2009292498A1Resistance testing deviceSHENZHEN FUTAIHONG PREC IND CO·Filed 2009·Application pending·0 cites
- 2538US2008184583A1Micrometer-based measuring system and method of using sameSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Application pending·0 cites
- 2637US11988999B2Transaction harmony degree-based method and system for transaction matching between power grid and building energySTATE GRID BEIJING ELECTRIC POWER CO·Filed 2021·Granted May 21, 2024·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →