Inventor · disambiguated record
Pil-Sik Hyun
Also filed as: HYUN PIL-SIK
6 granted patents·97 citations·filing 2000–2004
84Inventor score
Technology areasH10P
Files withSAMSUNG ELECTRONICS CO LTD6
Top patents by PatentIndex Score
6 records- 0182US6528333B1Method of and device for detecting micro-scratchesSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Mar 4, 2003·28 cites·18 claims
- 0276US6544802B1Wafer inspection system and method for selectively inspecting conductive pattern defectsSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Apr 8, 2003·20 cites·13 claims
- 0376US6449037B2Method of and device for detecting micro-scratchesSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Sep 10, 2002·19 cites·4 claims
- 0474US6912056B2Apparatus and method for measuring each thickness of a multilayer stacked on a substrateSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 28, 2005·19 cites·29 claims
- 0562US6515293B1Method and apparatus for detecting thickness of thin layer formed on a waferSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Feb 4, 2003·9 cites·2 claims
- 0649US7405817B2Method and apparatus for classifying defects of an objectSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jul 29, 2008·2 cites·43 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →