Inventor · disambiguated record
Pin-Ting Wang
Also filed as: WANG PIN-TING
5 granted patents·308 citations·filing 1998–2001
81Inventor score
Files withVANGUARD INT SEMICONDUCT CORP5
Top patents by PatentIndex Score
5 records- 0195US6077756AOverlay target pattern and algorithm for layer-to-layer overlay metrology for semiconductor processingVANGUARD INT SEMICONDUCT CORP·Filed 1998·Granted Jun 20, 2000·262 cites·21 claims
- 0270US5982044AAlignment pattern and algorithm for photolithographic alignment marks on semiconductor substratesVANGUARD INT SEMICONDUCT CORP·Filed 1998·Granted Nov 9, 1999·40 cites·24 claims
- 0353US6413885B2Method for patterning semiconductor devices on a silicon substrate using oxynitride filmVANGUARD INT SEMICONDUCT CORP·Filed 2001·Granted Jul 2, 2002·3 cites·5 claims
- 0440US6372642B2Method for patterning semiconductor devices with a resolution down to 0.12 μm on a silicon substrate using oxynitride film and deep UV lithographyVANGUARD INT SEMICONDUCT CORP·Filed 2001·Granted Apr 16, 2002·0 cites·7 claims
- 0533US6258734B1Method for patterning semiconductor devices on a silicon substrate using oxynitride filmVANGUARD INT SEMICONDUCT CORP·Filed 1999·Granted Jul 10, 2001·3 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →