Inventor · disambiguated record
Ping-Chieh Wu
Also filed as: WU PING · WU PING-CHIEH · WU PING-HSUI
23 granted patents·6 pending applications·101 citations·filing 2009–2025
94Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD16TAIWAN SEMICONDUCTOR MFG6ZTE CORP3WU PING CHIEH2CHUNGHWA TELECOM CO LTD1
Top patents by PatentIndex Score
29 records- 0197US12019974B2Geometric mask rule check with favorable and unfavorable zonesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jun 25, 2024·2 cites·20 claims
- 0296US11714951B2Geometric mask rule check with favorable and unfavorable zonesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Aug 1, 2023·4 cites·20 claims
- 0396US8954899B2Contour alignment systemTAIWAN SEMICONDUCTOR MFG·Filed 2012·Granted Feb 10, 2015·60 cites·20 claims
- 0489US12406130B2Geometric mask rule check with favorable and unfavorable zonesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Sep 2, 2025·0 cites·20 claims
- 0588US9262578B2Method for integrated circuit manufacturingTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Feb 16, 2016·9 cites·20 claims
- 0688US8681326B2Method and apparatus for monitoring mask process impact on lithography performanceTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Mar 25, 2014·9 cites·17 claims
- 0787US12159092B2Method for coloring circuit layout and system for performing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Dec 3, 2024·0 cites·20 claims
- 0887US2025298957A1Geometric mask rule check with favorable and unfavorable zonesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0984US9165095B2Target point generation for optical proximity correctionTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Oct 20, 2015·4 cites·20 claims
- 1079US10360339B2Method for integrated circuit manufacturingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jul 23, 2019·2 cites·20 claims
- 1176US11790145B2Method for coloring circuit layout and system for performing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Oct 17, 2023·0 cites·20 claims
- 1276US9411924B2Methodology for pattern density optimizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Aug 9, 2016·3 cites·20 claims
- 1375US11392742B2Method for coloring circuit layout and system for performing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jul 19, 2022·0 cites·20 claims
- 1475US10049178B2Methodology for pattern density optimizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Aug 14, 2018·1 cites·20 claims
- 1574US10161856B1Magneto-optical bio-detection devices having high sensitivityWU PING CHIEH·Filed 2018·Granted Dec 25, 2018·1 cites·10 claims
- 1671US10796055B2Method for coloring circuit layout and system for performing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Oct 6, 2020·0 cites·20 claims
- 1770US9026955B1Methodology for pattern correctionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted May 5, 2015·2 cites·17 claims
- 1867US8416393B2Cross quadrupole double lithography method and apparatus for semiconductor device fabrication using two aperturesWANG HSIEN-CHENG·Filed 2009·Granted Apr 9, 2013·2 cites·19 claims
- 1966US8477299B2Method and apparatus for monitoring mask process impact on lithography performanceWU PING CHIEH·Filed 2010·Granted Jul 2, 2013·1 cites·20 claims
- 2064US10860774B2Methodology for pattern density optimizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 8, 2020·0 cites·20 claims
- 2164US10509881B2Method for coloring circuit layout and system for performing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 17, 2019·0 cites·20 claims
- 2263US9189587B2Chip level critical point analysis with manufacturer specific dataTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Nov 17, 2015·1 cites·20 claims
- 2362US10747938B2Method for integrated circuit manufacturingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Aug 18, 2020·0 cites·20 claims
- 2452US2023005738A1Method of manufacturing semiconductor devices and pattern formation method for manufacturing semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Application pending·0 cites
- 2551US9280041B2Cross quadrupole double lithography method using two complementary aperturesTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Mar 8, 2016·0 cites·14 claims
- 2643US2010119050A1Auto provision system and method for customer premises equipmentCHUNGHWA TELECOM CO LTD·Filed 2009·Application pending·0 cites
- 2739US2016212204A1Domain Name Resolution Method, DNS Cache Server, and Final DNS ServerZTE CORP·Filed 2014·Application pending·0 cites
- 2838US2015317583A1Business Scheduling Method and Apparatus and Convergence DeviceZTE CORP·Filed 2013·Application pending·0 cites
- 2938US2015281097A1Service Download Acceleration Method And System, Service State Maintenance Method And DeviceZTE CORP·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →