Inventor · disambiguated record
Po-Ching He
Also filed as: HE PO-CHING
1 granted patent·5 pending applications·0 citations·filing 2023–2025
11Inventor score
Top patents by PatentIndex Score
6 records- 0167US12493004B2Method for determining parameters of three dimensional nanostructure and apparatus applying the sameIND TECH RES INST·Filed 2023·Granted Dec 9, 2025·0 cites·16 claims
- 0261US2025327762A1Composite semiconductor inspection systemNANOSEEX INC·Filed 2024·Application pending·0 cites
- 0358US2025341480A1X-ray measurement system and x-ray measurement methodNANOSEEX INC·Filed 2024·Application pending·0 cites
- 0457US2025147195A1X-ray measurement system with high signal resolutionNANOSEEX INC·Filed 2024·Application pending·0 cites
- 0548US2025334530A1X-ray reflection analysis system applying multiple x-ray beamsNANOSEEX INC·Filed 2025·Application pending·0 cites
- 0648US2025377318A1X-ray reflection analysis system and x-reflection analysis method utilizing multi-order mode signalsNANOSEEX INC·Filed 2025·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →