Inventor · disambiguated record
Po-Zeng Kang
Also filed as: KANG PO-ZENG
25 granted patents·6 pending applications·42 citations·filing 2011–2025
93Inventor score
Top patents by PatentIndex Score
31 records- 0197US11217526B2Semiconductor device with source resistor and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jan 4, 2022·4 cites·20 claims
- 0294US9064725B2FinFET with embedded MOS varactor and method of making sameTAIWAN SEMICONDUCTOR MFG·Filed 2012·Granted Jun 23, 2015·17 cites·20 claims
- 0391US10161976B2Output resistance testing methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 25, 2018·3 cites·20 claims
- 0490US11215513B2Device and method for temperature monitoring of a semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jan 4, 2022·4 cites·20 claims
- 0589US11670586B2Semiconductor device with source resistor and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jun 6, 2023·1 cites·20 claims
- 0688US10222412B2IC degradation management circuit, system and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Mar 5, 2019·3 cites·19 claims
- 0787US2025314536A1Temperature monitoring device manufacturing methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0887US2025359340A1Integrated circuit deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0986US10514417B2IC degradation management circuit, system and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 24, 2019·2 cites·20 claims
- 1085US2025317143A1Semiconductor device having hysteresis blockTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1184US12339174B2Temperature monitoring device and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Jun 24, 2025·0 cites·20 claims
- 1281US12272640B2Semiconductor device with source resistorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Apr 8, 2025·0 cites·20 claims
- 1380US2025201704A1Semiconductor device with source resistorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1477US12381552B2Power on control circuits and methods of operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Aug 5, 2025·0 cites·20 claims
- 1577US9343552B2FinFET with embedded MOS varactor and method of making sameTAIWAN SEMICONDUCTOR MFG·Filed 2015·Granted May 17, 2016·2 cites·20 claims
- 1676US11898916B2Device for temperature monitoring of a semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Feb 13, 2024·0 cites·20 claims
- 1769US11711076B2Power on control circuits and methods of operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jul 25, 2023·0 cites·20 claims
- 1868US12249601B2Integrated circuit device, method, layout, and systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Mar 11, 2025·0 cites·20 claims
- 1968US8856707B2Semiconductor device feature density gradient verificationTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Oct 7, 2014·1 cites·20 claims
- 2067US2025217567A1High voltage guard ring semiconductor device and method of forming sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 2166US10401407B2Output resistance testing integrated circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Sep 3, 2019·0 cites·20 claims
- 2266US8549453B2Semiconductor device feature density gradient verificationPENG YOUNG-CHOW·Filed 2012·Granted Oct 1, 2013·3 cites·10 claims
- 2363US8916955B2Nearly buffer zone free layout methodologyTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Dec 23, 2014·1 cites·20 claims
- 2459US12254257B2High voltage guard ring semiconductor device and method of forming sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Mar 18, 2025·0 cites·20 claims
- 2559US9287252B2Semiconductor mismatch reductionCHEN CHUNG-HUI·Filed 2011·Granted Mar 15, 2016·1 cites·20 claims
- 2658US10018660B2Output resistance testing structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jul 10, 2018·0 cites·20 claims
- 2756US9659919B2Nearly buffer zone free layout methodologyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted May 23, 2017·0 cites·20 claims
- 2853US2024014136A1Analog-cells-boundary region with buried power grid segment, semiconductor device including same and method of manufacturing sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 2949US10274536B2Time to current converterTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Apr 30, 2019·0 cites·20 claims
- 3049US9429607B2Low gds measurement methodology for MOSTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Aug 30, 2016·0 cites·18 claims
- 3140US10872189B2Uni-gate cell designTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 22, 2020·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →