Inventor · disambiguated record
Prakash Narayanan
Also filed as: NARAYANAN PRAKASH
41 granted patents·6 pending applications·120 citations·filing 2010–2023
97Inventor score
Files withTEXAS INSTRUMENTS INC39MICROSOFT TECHNOLOGY LICENSING LLC2NARAYANAN PRAKASH2PODDUTUR SUMANTH REDDY2MITTAL RAJESH1
Top patents by PatentIndex Score
47 records- 0197US10591540B2Compressed scan chains with three input mask gates and registersTEXAS INSTRUMENTS INC·Filed 2018·Granted Mar 17, 2020·8 cites·8 claims
- 0296US9952283B2Compressed scan chains with three input mask gates and registersTEXAS INSTRUMENTS INC·Filed 2015·Granted Apr 24, 2018·8 cites·6 claims
- 0396US9229055B2Decompressed scan chain masking circuit shift register with log2(n/n) cellsTEXAS INSTRUMENTS INC·Filed 2015·Granted Jan 5, 2016·8 cites·11 claims
- 0496US9091729B2Scan chain masking qualification circuit shift register and bit-field decodersTEXAS INSTRUMENTS INC·Filed 2014·Granted Jul 28, 2015·13 cites·2 claims
- 0595US11119152B2Functional circuitry, decompressor circuitry, scan circuitry, masking circuitry, qualification circuitryTEXAS INSTRUMENTS INC·Filed 2020·Granted Sep 14, 2021·3 cites·16 claims
- 0695US8887018B2Masking circuit removing unknown bit from cell in scan chainNARAYANAN PRAKASH·Filed 2010·Granted Nov 11, 2014·19 cites·4 claims
- 0793US10866280B2Scan chain self-testing of lockstep cores on resetTEXAS INSTRUMENTS INC·Filed 2019·Granted Dec 15, 2020·5 cites·20 claims
- 0893US9791505B1Full pad coverage boundary scanTEXAS INSTRUMENTS INC·Filed 2016·Granted Oct 17, 2017·5 cites·12 claims
- 0991US10184980B2Multiple input signature register analysis for digital circuitryTEXAS INSTRUMENTS INC·Filed 2016·Granted Jan 22, 2019·7 cites·7 claims
- 1091US9823282B2On-chip IR drop detectors for functional and test mode scenarios, circuits, processes and systemsTEXAS INSTRUMENTS INC·Filed 2015·Granted Nov 21, 2017·5 cites·17 claims
- 1190US11592483B2Compressed scan chain diagnosis by internal chain observation, processes, circuits, devices and systemsTEXAS INSTRUMENTS INC·Filed 2021·Granted Feb 28, 2023·1 cites·11 claims
- 1289US11073557B2Phase controlled codec block scan of a partitioned circuit deviceTEXAS INSTRUMENTS INC·Filed 2019·Granted Jul 27, 2021·3 cites·12 claims
- 1388US10579454B2Delay fault testing of pseudo static controlsTEXAS INSTRUMENTS INC·Filed 2017·Granted Mar 3, 2020·8 cites·15 claims
- 1488US9081063B2On-chip IR drop detectors for functional and test mode scenarios, circuits, processes and systemsNARAYANAN PRAKASH·Filed 2011·Granted Jul 14, 2015·8 cites·32 claims
- 1584US11921159B2Compressed scan chain diagnosis by internal chain observation, processes, circuits, devices and systemsTEXAS INSTRUMENTS INC·Filed 2023·Granted Mar 5, 2024·0 cites·20 claims
- 1683US11555853B2Scan chain self-testing of lockstep cores on resetTEXAS INSTRUMENTS INC·Filed 2020·Granted Jan 17, 2023·1 cites·20 claims
- 1783US11300615B2Transistion fault testing of funtionally asynchronous paths in an integrated circuitTEXAS INSTRUMENTS INC·Filed 2018·Granted Apr 12, 2022·2 cites·17 claims
- 1882US11209481B2Multiple input signature register analysis for digital circuitryTEXAS INSTRUMENTS INC·Filed 2018·Granted Dec 28, 2021·2 cites·7 claims
- 1982US10983161B2Full pad coverage boundary scanTEXAS INSTRUMENTS INC·Filed 2019·Granted Apr 20, 2021·1 cites·17 claims
- 2079US11852683B2Scan chain self-testing of lockstep cores on resetTEXAS INSTRUMENTS INC·Filed 2023·Granted Dec 26, 2023·0 cites·20 claims
- 2179US10331826B2False path timing exception handler circuitTEXAS INSTRUMENTS INC·Filed 2017·Granted Jun 25, 2019·2 cites·18 claims
- 2275US11879940B2Dynamic generation of ATPG mode signals for testing multipath memory circuitTEXAS INSTRUMENTS INC·Filed 2021·Granted Jan 23, 2024·0 cites·16 claims
- 2374US11933844B2Path based controls for ATE mode testing of multicell memory circuitTEXAS INSTRUMENTS INC·Filed 2021·Granted Mar 19, 2024·0 cites·20 claims
- 2474US11821945B2Full pad coverage boundary scanTEXAS INSTRUMENTS INC·Filed 2021·Granted Nov 21, 2023·0 cites·24 claims
- 2574US11709203B2Transition fault testing of functionally asynchronous paths in an integrated circuitTEXAS INSTRUMENTS INC·Filed 2022·Granted Jul 25, 2023·0 cites·20 claims
- 2674US11073553B2Dynamic generation of ATPG mode signals for testing multipath memory circuitTEXAS INSTRUMENTS INC·Filed 2018·Granted Jul 27, 2021·2 cites·18 claims
- 2774US10776546B2False path timing exception handler circuitTEXAS INSTRUMENTS INC·Filed 2019·Granted Sep 15, 2020·1 cites·2 claims
- 2873US8972807B2Integrated circuits capable of generating test mode control signals for scan testsMITTAL RAJESH·Filed 2012·Granted Mar 3, 2015·4 cites·20 claims
- 2970US11519964B2Phase controlled codec block scan of a partitioned circuit deviceTEXAS INSTRUMENTS INC·Filed 2021·Granted Dec 6, 2022·0 cites·20 claims
- 3070US11194944B2False path timing exception handler circuitTEXAS INSTRUMENTS INC·Filed 2020·Granted Dec 7, 2021·0 cites·2 claims
- 3169US11768726B2Delay fault testing of pseudo static controlsTEXAS INSTRUMENTS INC·Filed 2021·Granted Sep 26, 2023·0 cites·20 claims
- 3268US11194645B2Delay fault testing of pseudo static controlsTEXAS INSTRUMENTS INC·Filed 2020·Granted Dec 7, 2021·0 cites·15 claims
- 3368US8839063B2Circuits and methods for dynamic allocation of scan test resourcesTEXAS INSTRUMENTS INC·Filed 2013·Granted Sep 16, 2014·2 cites·20 claims
- 3462US10274538B2Full pad coverage boundary scanTEXAS INSTRUMENTS INC·Filed 2017·Granted Apr 30, 2019·0 cites·24 claims
- 3560US10460821B2Area efficient parallel test data path for embedded memoriesTEXAS INSTRUMENTS INC·Filed 2018·Granted Oct 29, 2019·1 cites·19 claims
- 3659US10818374B2Testing read-only memory using memory built-in self-test controllerTEXAS INSTRUMENTS INC·Filed 2019·Granted Oct 27, 2020·1 cites·18 claims
- 3757US11521698B2Testing read-only memory using memory built-in self-test controllerTEXAS INSTRUMENTS INC·Filed 2020·Granted Dec 6, 2022·0 cites·18 claims
- 3853US11047910B2Path based controls for ATE mode testing of multicell memory circuitTEXAS INSTRUMENTS INC·Filed 2018·Granted Jun 29, 2021·0 cites·20 claims
- 3949US12513195B2Secure cross-tenant accessMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2023·Granted Dec 30, 2025·0 cites·20 claims
- 4047US2025150458A1Cross-tenant access focusMICROSOFT TECHNOLOGY LICENSING LLC·Filed 2023·Application pending·0 cites
- 4145US9899103B2Area efficient parallel test data path for embedded memoriesTEXAS INSTRUMENTS INC·Filed 2017·Granted Feb 20, 2018·0 cites·20 claims
- 4245US2022358230A1Methods and apparatus for using scan operations to protect secure assetsTEXAS INSTRUMENTS INC·Filed 2021·Application pending·0 cites
- 4340US9053273B2IC delaying flip-flop output partial clock cycle for equalizing currentPODDUTUR SUMANTH REDDY·Filed 2012·Granted Jun 9, 2015·0 cites·7 claims
- 4439US2017125125A1Area-efficient parallel test data path for embedded memoriesTEXAS INSTRUMENTS INC·Filed 2016·Application pending·0 cites
- 4536US2011051883A1Rack systems and assemblies for fuel storageTRANSNUCLEAR INC·Filed 2010·Application pending·0 cites
- 4635US2016003900A1Self-test methods and systems for digital circuitsTEXAS INSTRUMENTS INC·Filed 2015·Application pending·0 cites
- 4725US2012062298A1Flip-flop architecture for mitigating hold closurePODDUTUR SUMANTH REDDY·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →