Inventor · disambiguated record
Pradip Patel
Also filed as: PATEL PRADIP · PATEL PRADIP MAGANLAL
23 granted patents·1 pending application·299 citations·filing 1995–2019
95Inventor score
Top patents by PatentIndex Score
24 records- 0191US7257745B2Array self repair using built-in self test techniquesIBM·Filed 2005·Granted Aug 14, 2007·22 cites·14 claims
- 0285US10890623B1Power saving scannable latch output driverIBM·Filed 2019·Granted Jan 12, 2021·2 cites·20 claims
- 0383US5659551AProgrammable computer system element with built-in self test method and apparatus for repair during power-onIBM·Filed 1995·Granted Aug 19, 1997·117 cites·9 claims
- 0480US7478297B2Merged MISR and output register without performance impact for circuits under testIBM·Filed 2007·Granted Jan 13, 2009·8 cites·4 claims
- 0579US9627012B1Shift register with opposite shift data and shift clock directionsIBM·Filed 2016·Granted Apr 18, 2017·5 cites·14 claims
- 0679US8055960B2Self test apparatus for identifying partially defective memoryIBM·Filed 2008·Granted Nov 8, 2011·10 cites·6 claims
- 0775US7305602B2Merged MISR and output register without performance impact for circuits under testIBM·Filed 2005·Granted Dec 4, 2007·8 cites·19 claims
- 0871US10593420B2Testing content addressable memory and random access memoryIBM·Filed 2018·Granted Mar 17, 2020·2 cites·11 claims
- 0970US10170199B2Testing content addressable memory and random access memoryIBM·Filed 2018·Granted Jan 1, 2019·2 cites·1 claims
- 1070US9697910B1Multi-match error detection in content addressable memory testingIBM·Filed 2016·Granted Jul 4, 2017·3 cites·18 claims
- 1169US10971242B2Sequential error capture during memory testIBM·Filed 2019·Granted Apr 6, 2021·2 cites·11 claims
- 1269US10079070B2Testing content addressable memory and random access memoryIBM·Filed 2016·Granted Sep 18, 2018·2 cites·9 claims
- 1368US10998075B2Built-in self-test for bit-write enabled memory arraysIBM·Filed 2019·Granted May 4, 2021·2 cites·20 claims
- 1466US5805789AProgrammable computer system element with built-in self test method and apparatus for repair during power-onIBM·Filed 1997·Granted Sep 8, 1998·49 cites·5 claims
- 1565US5633877AProgrammable built-in self test method and controller for arraysIBM·Filed 1995·Granted May 27, 1997·52 cites·18 claims
- 1658US8327207B2Memory testing systemDUFFY KEVIN J·Filed 2010·Granted Dec 4, 2012·2 cites·16 claims
- 1755US7529997B2Method for self-correcting cache using line delete, data logging, and fuse repair correctionIBM·Filed 2005·Granted May 5, 2009·3 cites·1 claims
- 1851US8361776B2Adaptation of Pitman Moore strain of rabies virus to primary chick embryo fibroblast cell culturesCADILA HEALTHCARE LTD·Filed 2008·Granted Jan 29, 2013·0 cites·9 claims
- 1946US7536613B2BIST address generation architecture for multi-port memoriesIBM·Filed 2004·Granted May 19, 2009·0 cites·5 claims
- 2046US7366953B2Self test method and apparatus for identifying partially defective memoryIBM·Filed 2004·Granted Apr 29, 2008·5 cites·6 claims
- 2142US6629280B1Method and apparatus for delaying ABIST startIBM·Filed 2000·Granted Sep 30, 2003·3 cites·6 claims
- 2240US9983261B2Partition-able storage of test results using inactive storage elementsIBM·Filed 2016·Granted May 29, 2018·0 cites·20 claims
- 2338US7275194B2Clock duty cycle based access timer combined with standard stage clocked output registerIBM·Filed 2005·Granted Sep 25, 2007·0 cites·8 claims
- 2432US2011296259A1Testing memory arrays and logic with abist circuitryBALAKRISHNAN BARGAV·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →