Inventor · disambiguated record
Pramodchandran Variyam
Also filed as: VARIYAM PRAMODCHANDRAN · VARIYAM PRAMODCHANDRAN N
9 granted patents·2 pending applications·126 citations·filing 2000–2024
87Inventor score
Top patents by PatentIndex Score
11 records- 0188US6661266B1All digital built-in self-test circuit for phase-locked loopsTEXAS INSTRUMENTS INC·Filed 2000·Granted Dec 9, 2003·51 cites·20 claims
- 0287US11150292B1Voltage spike detector and system for detecting voltage spikes in semiconductor devicesANORA LLC·Filed 2019·Granted Oct 19, 2021·4 cites·20 claims
- 0386US10107859B1Determining test conditions for at-speed transition delay fault tests on semiconductor devicesANORA LLC·Filed 2016·Granted Oct 23, 2018·5 cites·20 claims
- 0482US7006939B2Method and apparatus for low cost signature testing for analog and RF circuitsGEORGIA TECH RES INST·Filed 2001·Granted Feb 28, 2006·36 cites·17 claims
- 0579US6865500B1Method for testing analog circuitsGEORGIA TECH RES INST·Filed 2000·Granted Mar 8, 2005·24 cites·16 claims
- 0670US2025266284A1Systems and methods to handle semiconductor devices for testingANORA LLC·Filed 2024·Application pending·0 cites
- 0770US2025266283A1Systems and methods to handle semiconductor devices for testingANORA LLC·Filed 2024·Application pending·0 cites
- 0852US11940480B2Functional test head for printed circuit boardsANORA LLC·Filed 2022·Granted Mar 26, 2024·0 cites·20 claims
- 0946US6531972B2Apparatus and method including an efficient data transfer for analog to digital converter testingTEXAS INSTRUMENTS INC·Filed 2001·Granted Mar 11, 2003·5 cites·14 claims
- 1036US7466259B2Methods and apparatus to measure a voltage on an integrated circuitTEXAS INSTRUMENTS INC·Filed 2006·Granted Dec 16, 2008·0 cites·29 claims
- 1133US7259703B2Device for recording laser trim progress and for detecting laser beam misalignmentTEXAS INSTRUMENTS INC·Filed 2004·Granted Aug 21, 2007·1 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →