Inventor · disambiguated record
Q-Han Park
Also filed as: PARK Q-HAN
8 granted patents·2 pending applications·7 citations·filing 2008–2024
75Inventor score
Files withSAMSUNG ELECTRONICS CO LTD6KIM JIN-EUN1KIM TAE JIN1KOREA INST SCI & TECH1UNIV IND & ACAD COLLABORATION1
Top patents by PatentIndex Score
10 records- 0174US7816699B2Polarized light emitting diodeUNIV IND & ACAD COLLABORATION·Filed 2008·Granted Oct 19, 2010·6 cites·6 claims
- 0267US12212864B2Device and method for processing spectrum data of image sensorSAMSUNG ELECTRONICS CO LTD·Filed 2024·Granted Jan 28, 2025·0 cites·16 claims
- 0366US12359969B2Spectral camera and electronic device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Jul 15, 2025·0 cites·20 claims
- 0460US11962921B2Device and method for processing spectrum data of image sensorSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Apr 16, 2024·0 cites·17 claims
- 0552US9499400B2Optical devices and methods of controlling propagation directions of light from the optical devicesKIM JIN-EUN·Filed 2012·Granted Nov 22, 2016·1 cites·45 claims
- 0650US12332186B2Method and system for inspecting semiconductor wafer and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jun 17, 2025·0 cites·20 claims
- 0749US10481188B2System and method for non-contact measurement of optoelectronic properties of thin filmKOREA INST SCI & TECH·Filed 2018·Granted Nov 19, 2019·0 cites·15 claims
- 0848US10845232B2Mass flow controller, apparatus for manufacturing semiconductor device, and method for maintenance thereofSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Nov 24, 2020·0 cites·20 claims
- 0942US2012299047A1Light emitting device, light emitting device package, and light unitKIM TAE JIN·Filed 2012·Application pending·0 cites
- 1039US2019139796A1Monitoring apparatus and semiconductor manufacturing apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →