Inventor · disambiguated record
Qinglang Meng
Also filed as: Meng Qinglang
5 granted patents·4 citations·filing 2020–2022
65Inventor score
Technology areasH01J
Top patents by PatentIndex Score
5 records- 0186US11239044B2Wien filter and charged particle beam imaging apparatusZHONGKE JINGYUAN ELECTRON LTD BEIJING CN·Filed 2020·Granted Feb 1, 2022·2 cites·20 claims
- 0285US11295928B2Multi-pole deflector for charged particle beam and charged particle beam imaging apparatusZHONGKE JINGYUAN ELECTRON LTD BEIJING CN·Filed 2020·Granted Apr 5, 2022·2 cites·16 claims
- 0366US11756761B2Wien filter and charged particle beam imaging apparatusZHONGKE JINGYUAN ELECTRON LTD BEIJING CN·Filed 2022·Granted Sep 12, 2023·0 cites·18 claims
- 0449US11908658B2Scanning electron microscope device and electron beam inspection apparatusZHONGKE JINGYUAN ELECTRON LTD BEIJING CN·Filed 2021·Granted Feb 20, 2024·0 cites·16 claims
- 0547US11908657B2Scanning electron microscope device and electron beam inspection apparatusZHONGKE JINGYUAN ELECTRON LTD·Filed 2021·Granted Feb 20, 2024·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →