Inventor · disambiguated record
R. Jacob Baker
Also filed as: BAKER R · BAKER R J · BAKER R JACOB
118 granted patents·2 pending applications·3,265 citations·filing 1993–2015
99Inventor score
Top patents by PatentIndex Score
120 records- 0199US6504750B1Resistive memory element sensing using averagingMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 7, 2003·142 cites·24 claims
- 0298US6798705B2Noise resistant small signal sensing circuit for a memory deviceMICRON TECHNOLOGY INC·Filed 2003·Granted Sep 28, 2004·107 cites·5 claims
- 0398US6445231B1Digital dual-loop DLL design using coarse and fine loopsMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 3, 2002·146 cites·34 claims
- 0498US6069506AMethod and apparatus for improving the performance of digital delay locked loop circuitsMICRON TECHNOLOGY INC·Filed 1998·Granted May 30, 2000·175 cites·50 claims
- 0597US7538702B2Quantizing circuits with variable parametersMICRON TECHNOLOGY INC·Filed 2007·Granted May 26, 2009·35 cites·27 claims
- 0697US7095667B2Noise resistant small signal sensing circuit for a memory deviceMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 22, 2006·77 cites·5 claims
- 0797US6822892B2Resistive memory element sensing using averagingMICRON TECHNOLOGY INC·Filed 2002·Granted Nov 23, 2004·83 cites·3 claims
- 0896US7133307B2Resistive memory element sensing using averagingMICRON TECHNOLOGY INC·Filed 2003·Granted Nov 7, 2006·72 cites·9 claims
- 0996US6954391B2Noise resistant small signal sensing circuit for a memory deviceMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 11, 2005·73 cites·16 claims
- 1096US6954390B2Noise resistant small signal sensing circuit for a memory deviceMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 11, 2005·71 cites·7 claims
- 1196US6826102B2Noise resistant small signal sensing circuit for a memory deviceMICRON TECHNOLOGY INC·Filed 2002·Granted Nov 30, 2004·75 cites·21 claims
- 1296US6774690B2Digital dual-loop DLL design using coarse and fine loopsMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 10, 2004·72 cites·47 claims
- 1396US6410955B1Comb-shaped capacitor for use in integrated circuitsMICRON TECHNOLOGY INC·Filed 2001·Granted Jun 25, 2002·78 cites·33 claims
- 1496US6316976B1Method and apparatus for improving the performance of digital delay locked loop circuitsMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 13, 2001·69 cites·14 claims
- 1595US7366021B2Method and apparatus for sensing flash memory using delta sigma modulationMICRON TECHNOLOGY INC·Filed 2005·Granted Apr 29, 2008·45 cites·39 claims
- 1695US7009901B2System and method for sensing data stored in a resistive memory element using one bit of a digital countMICRON TECHNOLOGY INC·Filed 2003·Granted Mar 7, 2006·81 cites·29 claims
- 1795US6856564B2Noise resistant small signal sensing circuit for a memory deviceMICRON TECHNOLOGY INC·Filed 2004·Granted Feb 15, 2005·69 cites·5 claims
- 1895US6813208B2System and method for sensing data stored in a resistive memory element using one bit of a digital countMICRON TECHNOLOGY INC·Filed 2002·Granted Nov 2, 2004·80 cites·64 claims
- 1995US6567297B2Method and apparatus for sensing resistance values of memory cellsMICRON TECHNOLOGY INC·Filed 2001·Granted May 20, 2003·92 cites·53 claims
- 2094US6985375B2Adjusting the frequency of an oscillator for use in a resistive sense ampMICRON TECHNOLOGY INC·Filed 2003·Granted Jan 10, 2006·73 cites·41 claims
- 2194US6950487B2Phase splitter using digital delay locked loopsMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 27, 2005·59 cites·56 claims
- 2294US6914838B2Dual loop sensing scheme for resistive memory elementsMICRON TECHNOLOGY INC·Filed 2004·Granted Jul 5, 2005·76 cites·28 claims
- 2394US6901020B2Integrated charge sensing scheme for resistive memoriesMICRON TECHNOLOGY INC·Filed 2004·Granted May 31, 2005·67 cites·15 claims
- 2494US6870784B2Integrated charge sensing scheme for resistive memoriesMICRON TECHNOLOGY INC·Filed 2003·Granted Mar 22, 2005·67 cites·33 claims
- 2594US6795359B1Methods and apparatus for measuring current as in sensing a memory cellMICRON TECHNOLOGY INC·Filed 2003·Granted Sep 21, 2004·74 cites·34 claims
- 2694US6785156B2Method and apparatus for sensing resistance values of memory cellsMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 31, 2004·74 cites·6 claims
- 2794US6779126B1Phase detector for all-digital phase locked and delay locked loopsMICRON TECHNOLOGY INC·Filed 2000·Granted Aug 17, 2004·50 cites·17 claims
- 2894US6704881B1Method and apparatus for providing symmetrical output data for a double data rate DRAMMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 9, 2004·71 cites·49 claims
- 2993US7102932B2Input and output buffers having symmetrical operating characteristics and immunity from voltage variationsMICRON TECHNOLOGY INC·Filed 2004·Granted Sep 5, 2006·66 cites·36 claims
- 3093US6930942B2Method and apparatus for measuring current as in sensing a memory cellMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 16, 2005·69 cites·30 claims
- 3192US7372717B2Methods for resistive memory element sensing using averagingMICRON TECHNOLOGY INC·Filed 2005·Granted May 13, 2008·17 cites·13 claims
- 3292US6829188B2Dual loop sensing scheme for resistive memory elementsMICRON TECHNOLOGY INC·Filed 2002·Granted Dec 7, 2004·56 cites·22 claims
- 3391US8194477B2Subtraction circuits and digital-to-analog converters for semiconductor devicesBAKER R JACOB·Filed 2010·Granted Jun 5, 2012·8 cites·19 claims
- 3491US5953276AFully-differential amplifierMICRON TECHNOLOGY INC·Filed 1997·Granted Sep 14, 1999·98 cites·35 claims
- 3588US7817073B2Integrators for delta-sigma modulatorsMICRON TECHNOLOGY INC·Filed 2007·Granted Oct 19, 2010·14 cites·22 claims
- 3687US7768868B2Digital filters for semiconductor devicesMICRON TECHNOLOGY INC·Filed 2007·Granted Aug 3, 2010·15 cites·26 claims
- 3787US7733262B2Quantizing circuits with variable reference signalsMICRON TECHNOLOGY INC·Filed 2007·Granted Jun 8, 2010·13 cites·18 claims
- 3887US7667632B2Quantizing circuits for semiconductor devicesMICRON TECHNOLOGY INC·Filed 2007·Granted Feb 23, 2010·16 cites·30 claims
- 3986US7839703B2Subtraction circuits and digital-to-analog converters for semiconductor devicesMICRON TECHNOLOGY INC·Filed 2007·Granted Nov 23, 2010·9 cites·15 claims
- 4086US7495964B2Method and apparatus for sensing flash memory using delta sigma modulationMICRON TECHNOLOGY INC·Filed 2008·Granted Feb 24, 2009·16 cites·16 claims
- 4186US7330390B2Noise resistant small signal sensing circuit for a memory deviceMICRON TECHNOLOGY INC·Filed 2006·Granted Feb 12, 2008·10 cites·33 claims
- 4285US8093643B2Multi-resistive integrated circuit memoryBAKER R JACOB·Filed 2009·Granted Jan 10, 2012·7 cites·20 claims
- 4385US8089387B2Quantizing circuits with variable parametersBAKER R JACOB·Filed 2009·Granted Jan 3, 2012·6 cites·14 claims
- 4485US6577525B2Sensing method and apparatus for resistance memory deviceMICRON TECHNOLOGY INC·Filed 2001·Granted Jun 10, 2003·30 cites·35 claims
- 4584US7818638B2Systems and devices including memory with built-in self test and methods of making and using the sameMICRON TECHNOLOGY INC·Filed 2007·Granted Oct 19, 2010·12 cites·27 claims
- 4684US7151698B2Integrated charge sensing scheme for resistive memoriesMICRON TECHNOLOGY INC·Filed 2005·Granted Dec 19, 2006·12 cites·3 claims
- 4784US6597600B2Offset compensated sensing for magnetic random access memoryMICRON TECHNOLOGY INC·Filed 2001·Granted Jul 22, 2003·22 cites·9 claims
- 4884US6509245B2Electronic device with interleaved portions for use in integrated circuitsMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 21, 2003·21 cites·25 claims
- 4983US9336084B2Error detection for multi-bit memoryBAKER R JACOB·Filed 2012·Granted May 10, 2016·6 cites·23 claims
- 5083US8042012B2Systems and devices including memory with built-in self test and methods of making and using the sameMICRON TECHNOLOGY INC·Filed 2010·Granted Oct 18, 2011·7 cites·33 claims
Showing the top 50 of 120 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →