Inventor · disambiguated record
R. Fabian W. Pease
Also filed as: PEASE R FABIAN · PEASE R FABIAN W
24 granted patents·1 pending application·2,332 citations·filing 1990–2017
97Inventor score
Top patents by PatentIndex Score
25 records- 0199US5599695APrinting molecular library arrays using deprotection agents solely in the vapor phaseAFFYMETRIX INC·Filed 1995·Granted Feb 4, 1997·780 cites·24 claims
- 0298US6884984B2System and method for lithography process monitoring and controlBRION TECH INC·Filed 2004·Granted Apr 26, 2005·101 cites·53 claims
- 0398US6828542B2System and method for lithography process monitoring and controlBRION TECH INC·Filed 2003·Granted Dec 7, 2004·120 cites·40 claims
- 0498US6803554B2System and method for lithography process monitoring and controlBRION TECH INC·Filed 2003·Granted Oct 12, 2004·107 cites·49 claims
- 0598US5831070APrinting oligonucleotide arrays using deprotection agents solely in the vapor phaseAFFYMETRIX INC·Filed 1996·Granted Nov 3, 1998·356 cites·7 claims
- 0697US7053355B2System and method for lithography process monitoring and controlBRION TECH INC·Filed 2005·Granted May 30, 2006·93 cites·34 claims
- 0797US6969837B2System and method for lithography process monitoring and controlBRION TECH INC·Filed 2004·Granted Nov 29, 2005·82 cites·30 claims
- 0897US6969864B2System and method for lithography process monitoring and controlBRION TECH INC·Filed 2004·Granted Nov 29, 2005·71 cites·41 claims
- 0997US6806456B1System and method for lithography process monitoring and controlBRION TECH INC·Filed 2003·Granted Oct 19, 2004·86 cites·32 claims
- 1095US6906305B2System and method for aerial image sensingBRION TECH INC·Filed 2003·Granted Jun 14, 2005·69 cites·27 claims
- 1195US6239273B1Printing molecular library arraysAFFYMETRIX INC·Filed 1999·Granted May 29, 2001·154 cites·39 claims
- 1292US9520260B2Photo emitter X-ray source array (PeXSA)UNIV LELAND STANFORD JUNIOR·Filed 2013·Granted Dec 13, 2016·18 cites·10 claims
- 1392US8071395B2Methods and apparatus for magnetic separation of cellsDAVIS RONALD W·Filed 2008·Granted Dec 6, 2011·37 cites·41 claims
- 1492US7558419B1System and method for detecting integrated circuit pattern defectsBRION TECH INC·Filed 2004·Granted Jul 7, 2009·48 cites·35 claims
- 1587US6667394B2Printing oligonucleotide arraysAFFYMETRIX INC·Filed 2001·Granted Dec 23, 2003·20 cites·39 claims
- 1687US6064486ASystems, methods and computer program products for detecting the position of a new alignment mark on a substrate based on fitting to sample alignment signalsUNIV LELAND STANFORD JUNIOR·Filed 1998·Granted May 16, 2000·70 cites·48 claims
- 1786US5789748ALow voltage electron beam systemUNIV STANFORD·Filed 1997·Granted Aug 4, 1998·49 cites·11 claims
- 1879US5932966AElectron sources utilizing patterned negative electron affinity photocathodesINTEVAC INC·Filed 1997·Granted Aug 3, 1999·34 cites·26 claims
- 1972US9267943B2Apparatus for magnetic separation of cellsDAVIS RONALD W·Filed 2011·Granted Feb 23, 2016·3 cites·21 claims
- 2072US5135609AQuantum lithography mask and fabrication methodUNIV LELAND STANFORD JUNIOR·Filed 1990·Granted Aug 4, 1992·24 cites·11 claims
- 2168US9406488B2Enhanced photoelectron sources using electron bombardmentUNIV LELAND STANFORD JUNIOR·Filed 2014·Granted Aug 2, 2016·2 cites·10 claims
- 2266US7005795B2Electron bombardment of wide bandgap semiconductors for generating high brightness and narrow energy spread emission electronsUNIV LELAND STANFORD JUNIOR·Filed 2001·Granted Feb 28, 2006·7 cites·26 claims
- 2359US10741352B2Optically addressed, thermionic electron beam deviceUNIV BRITISH COLUMBIA·Filed 2017·Granted Aug 11, 2020·1 cites·20 claims
- 2448US2003175409A1Printing molecular library arraysAFFYMETRIX INC·Filed 2003·Application pending·0 cites
- 2542US9859097B2Vacuum tube electron microscopeUNIV LELAND STANFORD JUNIOR·Filed 2016·Granted Jan 2, 2018·0 cites·11 claims
Join the waitlist — get patent alerts
Get an alert when R. Fabian W. Pease files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →