Inventor · disambiguated record
Ran Badanes
Also filed as: BADANES RAN
3 granted patents·1 pending application·2 citations·filing 2020–2023
49Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD4
Top patents by PatentIndex Score
4 records- 0178US11449711B2Machine learning-based defect detection of a specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Sep 20, 2022·2 cites·20 claims
- 0251US12423800B2Machine learning based defect examination for semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Granted Sep 23, 2025·0 cites·20 claims
- 0348US12400319B2Defect examination on a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Aug 26, 2025·0 cites·18 claims
- 0444US2024428396A1Machine learning based defect examination for semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →