Inventor · disambiguated record
Ray Beffa
Also filed as: BEFFA RAY · BEFFA RAY J
29 granted patents·1,175 citations·filing 1995–2005
98Inventor score
Files withMICRON TECHNOLOGY INC29
Top patents by PatentIndex Score
29 records- 0195US5867505AMethod and apparatus for testing an integrated circuit including the step/means for storing an associated test identifier in association with integrated circuit identifier for each test to be performed on the integrated circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Feb 2, 1999·98 cites·34 claims
- 0293US6032264AApparatus and method implementing repairs on a memory deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Feb 29, 2000·96 cites·20 claims
- 0393US5910921ASelf-test of a memory deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 8, 1999·105 cites·31 claims
- 0491US6233185B1Wafer level burn-in of memory integrated circuitsMICRON TECHNOLOGY INC·Filed 1999·Granted May 15, 2001·88 cites·28 claims
- 0591US5982682ASelf-test circuit for memory integrated circuitsMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 9, 1999·87 cites·31 claims
- 0689US6058056AData compression circuit and method for testing memory devicesMICRON TECHNOLOGY INC·Filed 1998·Granted May 2, 2000·78 cites·14 claims
- 0789US5657284AApparatus and method for testing for defects between memory cells in packaged semiconductor memory devicesMICRON TECHNOLOGY INC·Filed 1995·Granted Aug 12, 1997·72 cites·20 claims
- 0885US5754486ASelf-test circuit for memory integrated circuitsMICRON TECHNOLOGY INC·Filed 1997·Granted May 19, 1998·55 cites·44 claims
- 0984US6347386B1System for optimizing the testing and repair time of a defective integrated circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Feb 12, 2002·20 cites·18 claims
- 1083US6119251ASelf-test of a memory deviceMICRON TECHNOLOGY INC·Filed 1998·Granted Sep 12, 2000·50 cites·68 claims
- 1182US6145092AApparatus and method implementing repairs on a memory deviceMICRON TECHNOLOGY INC·Filed 1999·Granted Nov 7, 2000·39 cites·36 claims
- 1281US5852581AMethod of stress testing memory integrated circuitsMICRON TECHNOLOGY INC·Filed 1996·Granted Dec 22, 1998·42 cites·23 claims
- 1380US6625073B1Apparatus and method for testing for defects between memory cells in packaged semiconductor memory devicesMICRON TECHNOLOGY INC·Filed 1996·Granted Sep 23, 2003·42 cites·24 claims
- 1479US6477662B1Apparatus and method implementing repairs on a memory deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 5, 2002·22 cites·16 claims
- 1578US6128756ASystem for optimizing the testing and repair time of a defective integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Oct 3, 2000·27 cites·13 claims
- 1677US6181154B1Method and apparatus for testing of dielectric defects in a packaged semiconductor memory deviceMICRON TECHNOLOGY INC·Filed 1999·Granted Jan 30, 2001·29 cites·10 claims
- 1776US5898629ASystem for stressing a memory integrated circuit dieMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 27, 1999·31 cites·58 claims
- 1873US7069484B2System for optimizing anti-fuse repair time using fuse idMICRON TECHNOLOGY INC·Filed 2003·Granted Jun 27, 2006·13 cites·28 claims
- 1972US7120073B2Integrated circuit devices having reducing variable retention characteristicsMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 10, 2006·7 cites·20 claims
- 2071US6622270B2System for optimizing anti-fuse repair time using fuse IDMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 16, 2003·12 cites·11 claims
- 2170US6079037AMethod and apparatus for detecting intercell defects in a memory deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 20, 2000·25 cites·16 claims
- 2270US5885846AMethod and apparatus for testing of dielectric defects in a packaged semiconductor memory deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 23, 1999·21 cites·18 claims
- 2368US6094734ATest arrangement for memory devices using a dynamic row for creating test dataMICRON TECHNOLOGY INC·Filed 1997·Granted Jul 25, 2000·27 cites·26 claims
- 2468US5966025AMethod and apparatus for testing of dielectric defects in a packaged semiconductor memory deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Oct 12, 1999·19 cites·5 claims
- 2567US6003149ATest method and apparatus for writing a memory array with a reduced number of cyclesMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 14, 1999·26 cites·35 claims
- 2663US6442719B1Method and apparatus for detecting intercell defects in a memory deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Aug 27, 2002·11 cites·19 claims
- 2761USRE38956EData compression circuit and method for testing memory devicesMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 31, 2006·11 cites·29 claims
- 2861US5965902AMethod and apparatus for testing of dielectric defects in a packaged semiconductor memory deviceMICRON TECHNOLOGY INC·Filed 1995·Granted Oct 12, 1999·15 cites·16 claims
- 2956US6898138B2Method of reducing variable retention characteristics in DRAM cellsMICRON TECHNOLOGY INC·Filed 2002·Granted May 24, 2005·7 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →